Structural Software-Based Self-Test of Network-on-Chip

被引：0

作者：

Dalirsani, Atefe ^{[1
]}

Imhof, Michael E. ^{[1
]}

Wunderlich, Hans-Joachim ^{[1
]}

机构：

[1] Univ Stuttgart, Inst Comp Architecture & Comp Engn, Stuttgart, Germany

来源：

2014 IEEE 32ND VLSI TEST SYMPOSIUM (VTS) | 2014年

关键词：

Network-on-Chip (NoC); Software-Based Self-Test (SBST); Automatic Test Pattern Generation (ATPG); Boolean Satisfiability (SAT); DIAGNOSIS;

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Software-Based Self-Test (SBST) is extended to the switches of complex Network-on-Chips (NoC). Test patterns for structural faults are turned into valid packets by using satisfiability (SAT) solvers. The test technique provides a high fault coverage for both manufacturing test and online test.

引用

页数：6

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