Microfabricated probes for near-field optical microscopy

被引:0
|
作者
Heinzelmann, H [1 ]
Eckert, R [1 ]
Freyland, JM [1 ]
Gersen, H [1 ]
Schürmann, G [1 ]
Noell, W [1 ]
Staufer, U [1 ]
de Rooij, N [1 ]
机构
[1] Ctr Suisse Elect & Microtech SA, Nanoscale Technol, Neuchatel, Switzerland
关键词
D O I
10.1109/OMEMS.2000.879658
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Microfabrication of probes for near-field optical microscopy is a promising approach to improve probe quality, reproducibility, and availability/cost. We report on cantilevered probes with integrated quartz tips allowing near-field optical imaging of single fluorophores with 32 nm lateral resolution.
引用
收藏
页码:127 / 128
页数:2
相关论文
共 50 条
  • [21] Characterization of near-field optical probes
    Vohnsen, B
    Bozhevolnyi, SI
    APPLIED OPTICS, 1999, 38 (09) : 1792 - 1797
  • [22] Microfabrication of near-field optical probes
    Ruiter, AGT
    Moers, MHP
    vanHulst, NF
    deBoer, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 597 - 601
  • [23] Microfabrication of near-field optical probes
    J Vac Sci Technol B, 2 (597):
  • [24] Optical properties of microfabricated fully-metal-coated near-field probes in collection mode
    Descrovi, E
    Vaccaro, L
    Aeschimann, L
    Nakagawa, W
    Staufer, U
    Herzig, HP
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2005, 22 (07) : 1432 - 1441
  • [25] Apertureless metallic probes for near-field microscopy
    Inouye, Y
    NEAR-FIELD OPTICS AND SURFACE PLASMON POLARITONS, 2001, 81 : 29 - 48
  • [26] Near-field microscopy probes quantum dots
    Robinson, K
    PHOTONICS SPECTRA, 2002, 36 (01) : 33 - 34
  • [27] Coaxial probes for scanning near-field microscopy
    Leinhos, T
    Rudow, O
    Stopka, M
    Vollkopf, A
    Oesterschulze, E
    JOURNAL OF MICROSCOPY, 1999, 194 : 349 - 352
  • [28] Standard sample probes for characterizing optical apertures in near-field scanning optical microscopy
    Imhof, JM
    Kwak, ES
    Vanden Bout, DA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (04): : 2424 - 2428
  • [29] Ultrasharp carbon whisker optical fiber probes for scanning near-field optical microscopy
    Mensi, Mounir
    Mikhailov, Gennadii
    Pyatkin, Sergey
    Adamcik, Jozef
    Sekatskii, Sergey
    Dietler, Giovanni
    NANOPHOTONICS III, 2010, 7712
  • [30] Analysis of fiber probes of scanning near-field optical microscope by field emission microscopy
    Sekatskii, SK
    Mironov, BN
    Lapshin, DA
    Dietler, G
    Letokhov, VS
    ULTRAMICROSCOPY, 2001, 89 (1-3) : 83 - 87