Determination of the α-Al2O3(0001) surface relaxation and termination by measurements of crystal truncation rods

被引：149

作者：

Guenard, P ^{[1
]}

Renaud, G

Barbier, A

Gautier-Soyer, M

机构：

[1] CEA, Dept Rech Fondamentale Mat Condensee, Grenoble, France

[2] CEA Saclay, Dept Rech Etat Condense Atomes & Mol, F-91191 Gif Sur Yvette, France

来源：

SURFACE REVIEW AND LETTERS | 1998年 / 5卷 / 01期

关键词：

D O I：

10.1142/S0218625X98000591

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have investigated the unreconstructed (0001) surface structure of sapphire (alpha-Al2O3) by grazing incidence X-ray scattering. Modulations along the crystal truncation rods were analyzed in order to determine the chemical nature of the terminating plane, and the structural relaxations of the first few atomic planes below the surface. The most likely model yields a single Al layer termination with relaxations of the first four planes of -51%, +16%, -29% and +20% respectively. These results compare well with the most recent theoretical calculations on this surface.

引用

页码：321 / 324

页数：4

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