A multi-code 3D measurement technique based on deep learning

被引:38
作者
Yao, Pengcheng [1 ,2 ]
Gai, Shaoyan [1 ,2 ]
Chen, Yuchong [1 ,2 ]
Chen, Wenlong [1 ,2 ]
Da, Feipeng [1 ,2 ,3 ]
机构
[1] Southeast Univ, Sch Automat, Nanjing 210096, Jiangsu, Peoples R China
[2] Key Lab Measurement & Control Complex Syst Engn, Minist Educ, Nanjing 210096, Jiangsu, Peoples R China
[3] Southeast Univ, Shenzhen Res Inst, Shenzhen 518000, Guangdong, Peoples R China
关键词
3D measurement; Deep learning; Multi-code pattern; Absolute phase; 3-DIMENSIONAL SHAPE MEASUREMENT; FOURIER-TRANSFORM PROFILOMETRY; FRINGE PROJECTION PROFILOMETRY; ABSOLUTE PHASE RETRIEVAL; CODING METHOD; AUTOMATIC-MEASUREMENT; NEURAL-NETWORK; GRAY-CODE; ALGORITHM; FREQUENCY;
D O I
10.1016/j.optlaseng.2021.106623
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Benefiting from the merits of low cost, high accuracy and high resolution, fringe projection profilometry has been developing rapidly over the past decades. However, recovering the absolute phase with high accuracy and robustness effectively has always been significant challenge in fringe projection profilometry. In this paper, an intelligent Multi-code Deep Learning (MCDL) technique is developed to solve the high-slope absolute phase from only two patterns with high accuracy and robustness. Two sub-networks are designed for obtaining the wrapped phase and the fringe order. Specially, the proposed MCDL method can solve the high-level fringe orders by only a special multi-code pattern itself through a cooperative multi-connected convolutional neural network. By training the deep network with numerous datasets, the principle of unwrapping phase can be learned by the MCDL approach. Experiments demonstrate that the proposed method has the abilities of high robustness, efficiency and accuracy (measurement error: 0.0189mm, FOV: 250 mm x 200 mm), indicating potential applications for highspeed and high-accuracy three dimensional optical measurement.
引用
收藏
页数:8
相关论文
共 40 条
[1]   Pixel-wise absolute phase unwrapping using geometric constraints of structured light system [J].
An, Yatong ;
Hyun, Jae-Sang ;
Zhang, Song .
OPTICS EXPRESS, 2016, 24 (16) :18445-18459
[2]  
Bimber O., 2005, Spatial augmented reality, DOI 10.1201/b10624
[3]   Marker encoded fringe projection profilometry for efficient 3D model acquisition [J].
Budianto, B. ;
Lun, P. K. D. ;
Hsung, Tai-Chiu .
APPLIED OPTICS, 2014, 53 (31) :7442-7453
[4]   Quantized phase coding and connected region labeling for absolute phase retrieval [J].
Chen, Xiangcheng ;
Wang, Yuwei ;
Wang, Yajun ;
Ma, Mengchao ;
Zeng, Chunnian .
OPTICS EXPRESS, 2016, 24 (25) :28613-28624
[5]   2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J].
CHENG, YY ;
WYANT, JC .
APPLIED OPTICS, 1984, 23 (24) :4539-4543
[6]   A flexible phase-shifting method with absolute phase marker retrieval [J].
Cui, Haihua ;
Liao, Wenhe ;
Dai, Ning ;
Cheng, Xiaosheng .
MEASUREMENT, 2012, 45 (01) :101-108
[7]   3D information detection with novel five composite fringe patterns [J].
Deng, Huaxia ;
Deng, Ji ;
Ma, Mengchao ;
Zhang, Jin ;
Yu, Liandong ;
Wang, Ziming .
MODERN PHYSICS LETTERS B, 2017, 31 (19-21)
[8]   Fringe pattern analysis using deep learning [J].
Feng, Shijie ;
Chen, Qian ;
Gu, Guohua ;
Tao, Tianyang ;
Zhang, Liang ;
Hu, Yan ;
Yin, Wei ;
Zuo, Chao .
ADVANCED PHOTONICS, 2019, 1 (02)
[9]   Micro deep learning profilometry for high-speed 3D surface imaging [J].
Feng, Shijie ;
Zuo, Chao ;
Yin, Wei ;
Gu, Guohua ;
Chen, Qian .
OPTICS AND LASERS IN ENGINEERING, 2019, 121 :416-427
[10]   A novel phase-shifting method based on strip marker [J].
Gai, Shaoyan ;
Da, Feipeng .
OPTICS AND LASERS IN ENGINEERING, 2010, 48 (02) :205-211