Software Defect Prediction Using Principal Component Analysis and Naive Bayes Algorithm

被引:3
|
作者
Dhamayanthi, N. [1 ]
Lavanya, B. [1 ]
机构
[1] Univ Madras, Dept Comp Sci, Chennai, Tamil Nadu, India
来源
PROCEEDINGS OF INTERNATIONAL CONFERENCE ON COMPUTATIONAL INTELLIGENCE AND DATA ENGINEERING (ICCIDE 2018) | 2019年 / 28卷
关键词
Software defect prediction; Fault proneness; Classification; Feature selection; Naive Bayes classification algorithm; Principal component analysis; Software quality; Machine learning algorithms; Fault prediction; Dimensionality reduction; Data mining; Machine learning techniques; NASA Metrics Data Program; Stratified tenfold cross-validation; Reliable software; Prediction modeling;
D O I
10.1007/978-981-13-6459-4_24
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
How can I deliver defect-free software? Can I achieve more with less resources? How can I reduce time, effort, and cost involved in developing software? Software defect prediction is an important area of research which can significantly help the software development teams grappling with these questions in an effective way. A small increase in prediction accuracy will go a long way in helping software development teams improve their efficiency. In this paper, we have proposed a framework which uses PCA for dimensionality reduction and Naive Bayes classification algorithm for building the prediction model. We have used seven projects from NASA Metrics Data Program for conducting experiments. We have seen an average increase of 10.3% in prediction accuracy when the learning algorithm is applied with the key features extracted from the datasets.
引用
收藏
页码:241 / 248
页数:8
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