Probing Interfacial Electronic Structures in Atomic Layer LaMnO3 and SrTiO3 Superlattices

被引:63
作者
Shah, Amish B. [1 ,2 ]
Ramasse, Quentin M. [3 ]
Zhai, Xiaofang [2 ,4 ]
Wen, Jian Guo [2 ]
May, Steve J. [5 ,6 ]
Petrov, Ivan [2 ]
Bhattacharya, Anand [5 ,6 ]
Abbamonte, Peter [2 ,4 ]
Eckstein, James N. [2 ,4 ]
Zuo, Jian-Min [1 ,2 ]
机构
[1] Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USA
[2] Univ Illinois, Fredrick Seitz Mat Res Lab, Urbana, IL 61801 USA
[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA
[4] Univ Illinois, Dept Phys, Urbana, IL 61801 USA
[5] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
[6] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA
关键词
X-RAY-ABSORPTION;
D O I
10.1002/adma.200904198
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The interfacial electronic structure characterization of a mx(LaMnO3)/nx(SrTiO3) superlattice based on scanning transmission electron microscopy and electron energy loss spectroscopy. Evidence of interfacial band alignment and electron transfer are presented based on the observation of O K edge of individual transition metal and oxygen atomic columns. Electron probe aberration correction was essential for the high spatial resolution mapping of interfacial electronic states.
引用
收藏
页码:1156 / +
页数:6
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