Hydrogen and surface excitation in electron spectra of polyethylene

被引:30
作者
Orosz, GT
Gergely, G
Menyhard, M
Tóth, J
Varga, D
Lesiak, B
Jablonski, A
机构
[1] Res Inst Tech Phys & Mat Sci, H-1525 Budapest, Hungary
[2] ATOMKI, Inst Nucl Res, H-4001 Debrecen, Hungary
[3] Polish Acad Sci, Inst Phys Chem, PL-01224 Warsaw, Poland
关键词
electron-solid scattering and transmission-elastic; alkenes; hydrogen atom;
D O I
10.1016/j.susc.2004.05.106
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The inelastic mean free path (IMFP) of electrons of polyethylene was determined by elastic peak electron spectroscopy (EPES). Hydrogen cannot be detected directly by conventional electron spectroscopies, such as Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), reflection electron energy loss spectroscopy (REELS) and EPES. The evaluation of electron spectra on polyethylene (PE) and other polymers needs corrections for hydrogen and surface excitation. Electron elastic backscattering on H atoms appears in the splitting of the elastic peak, shifting and Doppler broadening of the H peak produced by recoil effect. This shift is 0.34-3.8 eV for E = 0.2-2.0 keV. Experiments resulted in separating the very low H elastic signal from the background. Surface excitation is characterised by the parameter P-se(E) which was described by formulae of Tanuma, Werner and Chen, using different definitions. The P-se(E) of PE was determined by our new procedure. Si and Ag were used as reference samples for its determination by EPES experiments. Experiments were made with a HSA spectrometer of high energy resolution. Their Monte Carlo evaluation was based on the NIST 64 database and IMFP of Tanuma et al., Gries and Cumpson. P-se(E) of PE was determined by best fit of experimental parameters, comparing the different IMFPs and surface excitation correction factors of Chen and Werner et al. The criteria of best fit are the RMS deviations from the different corrections. The total backscattering spectra (elastic and inelastic) of PE, C and Cu resulted in indirect observation of H.. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:544 / 548
页数:5
相关论文
共 24 条
[1]   ANALYTICAL EXPRESSIONS FOR THE ELECTRON BACKSCATTERING COEFFICIENT [J].
AUGUST, HJ ;
WERNISCH, J .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 114 (02) :629-633
[2]   ELASTISCHE ENERGIEVERLUSTE KRISTALLGESTREUTER ELEKTRONEN [J].
BOERSCH, H ;
WOLTER, R ;
SCHOENEBECK, H .
ZEITSCHRIFT FUR PHYSIK, 1967, 199 (01) :124-+
[3]   Surface effects on angular distributions in X-ray-photoelectron spectroscopy [J].
Chen, YF .
SURFACE SCIENCE, 2002, 519 (1-2) :115-124
[4]   Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure-property relationships [J].
Cumpson, PJ .
SURFACE AND INTERFACE ANALYSIS, 2001, 31 (01) :23-34
[5]   Elastic backscattering of electrons: determination of physical parameters of electron transport processes by elastic peak electron spectroscopy [J].
Gergely, G .
PROGRESS IN SURFACE SCIENCE, 2002, 71 (1-4) :31-88
[6]  
GERGELY G, 1994, SURF INTERFACE ANAL, V22, P1073
[7]   Carbon reference Auger electron spectra measured with a high-performance cylindrical mirror analyzer [J].
Goto, K ;
Takeichi, Y .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1996, 14 (03) :1408-1414
[8]  
GRIES WH, 1996, SURF INTERFACE ANAL, V24, P42
[9]   Dependence of experimentally determined inelastic mean free paths of electrons on the measurement geometry [J].
Jablonski, A ;
Jiricek, P .
SURFACE SCIENCE, 1998, 412-13 :42-54
[10]   SOME APPLICATIONS OF HIGH-ENERGY, HIGH-RESOLUTION AUGER-ELECTRON SPECTROSCOPY USING BREMSSTRAHLUNG RADIATION [J].
KOVER, L ;
VARGA, D ;
CSERNY, I ;
TOTH, J ;
TOKESI, K .
SURFACE AND INTERFACE ANALYSIS, 1992, 19 (1-12) :9-15