Massively parallel adaptive mesh refinement and coarsening for dynamic fracture simulations
被引:9
作者:
Alhadeff, Andrei
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Pontificia Univ Catolica Rio de Janeiro, Tecgraf PUC Rio Inst, Rio de Janeiro, RJ, BrazilPontificia Univ Catolica Rio de Janeiro, Tecgraf PUC Rio Inst, Rio de Janeiro, RJ, Brazil
Alhadeff, Andrei
[1
]
Leon, Sofie E.
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机构:
Univ Illinois, Dept Civil & Environm Engn, Champaign, IL USA
Ctr Res & Interdisciplinary, Paris, FrancePontificia Univ Catolica Rio de Janeiro, Tecgraf PUC Rio Inst, Rio de Janeiro, RJ, Brazil
Leon, Sofie E.
[2
,3
]
Celes, Waldemar
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机构:
Pontificia Univ Catolica Rio de Janeiro, Tecgraf PUC Rio Inst, Rio de Janeiro, RJ, BrazilPontificia Univ Catolica Rio de Janeiro, Tecgraf PUC Rio Inst, Rio de Janeiro, RJ, Brazil
Celes, Waldemar
[1
]
Paulino, Glaucio H.
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机构:
Georgia Inst Technol, Sch Civil & Environm Engn, Atlanta, GA 30332 USAPontificia Univ Catolica Rio de Janeiro, Tecgraf PUC Rio Inst, Rio de Janeiro, RJ, Brazil
Paulino, Glaucio H.
[4
]
机构:
[1] Pontificia Univ Catolica Rio de Janeiro, Tecgraf PUC Rio Inst, Rio de Janeiro, RJ, Brazil
[2] Univ Illinois, Dept Civil & Environm Engn, Champaign, IL USA
[3] Ctr Res & Interdisciplinary, Paris, France
[4] Georgia Inst Technol, Sch Civil & Environm Engn, Atlanta, GA 30332 USA
We use the graphical processing unit (GPU) to perform dynamic fracture simulation using adaptively refined and coarsened finite elements and the inter-element cohesive zone model. Due to the limited memory available on the GPU, we created a specialized data structure for efficient representation of the evolving mesh given. To achieve maximum efficiency, we perform finite element calculation on a nodal basis (i.e., by launching one thread per node and collecting contributions from neighboring elements) rather than by launching threads per element, which requires expensive graph coloring schemes to avoid concurrency issues. These developments made possible the parallel adaptive mesh refinement and coarsening schemes to systematically change the topology of the mesh. We investigate aspects of the parallel implementation through microbranching examples, which has been explored experimentally and numerically in the literature. First, we use a reduced-scale version of the experimental specimen to demonstrate the impact of variation in floating point operations on the final fracture pattern. Interestingly, the parallel approach adds some randomness into the finite element simulation on the structured mesh in a similar way as would be expected from a random mesh. Next, we take advantage of the speedup of the implementation over a similar serial implementation to simulate a specimen whose size matches that of the actual experiment. At this scale, we are able to make more direct comparisons to the original experiment and find excellent agreement with those results.
机构:
Pontifical Catholic Univ Rio De Janeiro, Tecgraf PUC Rio Comp Sci Dept, BR-22450900 Rio De Janeiro, RJ, BrazilPontifical Catholic Univ Rio De Janeiro, Tecgraf PUC Rio Comp Sci Dept, BR-22450900 Rio De Janeiro, RJ, Brazil
Espinha, Rodrigo
;
Park, Kyoungsoo
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Yonsei Univ, Sch Civil & Environm Engn, Seoul, South KoreaPontifical Catholic Univ Rio De Janeiro, Tecgraf PUC Rio Comp Sci Dept, BR-22450900 Rio De Janeiro, RJ, Brazil
Park, Kyoungsoo
;
Paulino, Glaucio H.
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机构:
Univ Illinois, Dept Civil & Environm Engn, Urbana, IL 61801 USAPontifical Catholic Univ Rio De Janeiro, Tecgraf PUC Rio Comp Sci Dept, BR-22450900 Rio De Janeiro, RJ, Brazil
机构:
Pontifical Catholic Univ Rio De Janeiro, Tecgraf PUC Rio Comp Sci Dept, BR-22450900 Rio De Janeiro, RJ, BrazilPontifical Catholic Univ Rio De Janeiro, Tecgraf PUC Rio Comp Sci Dept, BR-22450900 Rio De Janeiro, RJ, Brazil
Espinha, Rodrigo
;
Park, Kyoungsoo
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h-index: 0
机构:
Yonsei Univ, Sch Civil & Environm Engn, Seoul, South KoreaPontifical Catholic Univ Rio De Janeiro, Tecgraf PUC Rio Comp Sci Dept, BR-22450900 Rio De Janeiro, RJ, Brazil
Park, Kyoungsoo
;
Paulino, Glaucio H.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Illinois, Dept Civil & Environm Engn, Urbana, IL 61801 USAPontifical Catholic Univ Rio De Janeiro, Tecgraf PUC Rio Comp Sci Dept, BR-22450900 Rio De Janeiro, RJ, Brazil