Electron emission from carbon induced by the ions C+O+CO+ and O2+

被引：3
|
作者：
Dogar, A. H.
Ulah, Shakir
Qayyum, A.
机构：
[1] Pakistan Inst Nucl Sci & Technol, Phys Div, Islamabad, Pakistan
[2] Pakistan Inst Engn & Appl Sci, Islamabad, Pakistan
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2007年 / 260卷 / 02期
关键词：
lon-induced electron emission; carbon surface; molecular effect;
D O I：
10.1016/j.nimb.2007.03.081
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The secondary electron yield from carbon induced by the ions C+, O+, CO+ and O-2(+) has been measured as a function of ion energy in the range of 2 to 20 keV. It has been observed that electron yield from carbon increases with projectile energy. By comparing electron yields induced by equally fast atomic and molecular projectiles, a molecular effect as a yield reduction has been observed. The measured molecular effect was stronger than the predictions of sweeping-out-electron model. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：525 / 528
页数：4
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