Ultrasound excited thermography using frequency modulated elastic waves

被引:57
作者
Zweschper, T
Dillenz, A
Riegert, G
Scherling, D
Busse, G
机构
[1] Univ Stuttgart, Inst Polymer Testing & Polymer Sci, Dept Nondestruct Testing, D-70569 Stuttgart, Germany
[2] E De Vis Enhanced Defect Visualizat, D-71229 Leonberg, Germany
[3] Airbus Germany GmbH, D-28199 Bremen, Germany
关键词
D O I
10.1784/insi.45.3.178.53162
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Ultrasound excited thermography allows for defect selective imaging using thermal waves that are generated by elastic waves. The mechanism involved is local friction or hysteresis which turns a dynamically loaded defect into a heat source which is identified by a thermography system. If the excitation frequency matches to a resonance of the vibrating system, temperature patterns can occur that are caused by standing elastic waves. These undesirable patterns can affect the detection of damages in a negative way. We describe a technique how the defect delectability of ultrasound activated thermography can be improved. With the objective of a preferably diffuse distributed sonic field we applied frequency modulated ultrasound to the material. This way the standing waves can be eliminated or reduced and the defect delectability is improved.
引用
收藏
页码:178 / 182
页数:5
相关论文
共 24 条
  • [1] Beaudoin JL, 1985, SPIE, V590, P287
  • [2] THERMAL WAVE IMAGING WITH PHASE SENSITIVE MODULATED THERMOGRAPHY
    BUSSE, G
    WU, D
    KARPEN, W
    [J]. JOURNAL OF APPLIED PHYSICS, 1992, 71 (08) : 3962 - 3965
  • [3] OPTOACOUSTIC PHASE-ANGLE MEASUREMENT FOR PROBING A METAL
    BUSSE, G
    [J]. APPLIED PHYSICS LETTERS, 1979, 35 (10) : 759 - 760
  • [4] Carlomagno G M., 1976, PROC 3 INFRARED INFO, pp 33
  • [5] DILLENZ D, 2001, PROGR ULTRASOUND PHA
  • [6] Infrared imaging of defects heated by a sonic pulse
    Favro, LD
    Han, XY
    Ouyang, Z
    Sun, G
    Sui, H
    Thomas, RL
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (06) : 2418 - 2421
  • [7] FOURIER J, 1824, MEMOIRES ACAD SCI, V4, P185
  • [8] Galmiche F, 2000, AIP CONF PROC, V509, P609, DOI 10.1063/1.1306105
  • [9] KUO PK, 1987, PHOTOACOUSTIC PHOTOT, P415
  • [10] MAGNITUDE AND PHASE IN THERMAL WAVE IMAGING
    LEHTO, A
    JAARINEN, J
    TIUSANEN, T
    JOKINEN, M
    LUUKKALA, M
    [J]. ELECTRONICS LETTERS, 1981, 17 (11) : 364 - 365