NCR:: A self-scaling, self-calibrated metric for IDDQ outlier identification

被引：0

作者：

Sabade, SS ^{[1
]}

Walker, DMH ^{[1
]}

机构：

[1] Texas A&M Univ, Dept Comp Sci, College Stn, TX 77843 USA

来源：

2002 45TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL I, CONFERENCE PROCEEDINGS | 2002年

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

I-DDQ testing is an important component of a test suite. However, increasing leakage current values with each technology node render single pass/fail limit setting approach obsolete. This is further worsened due to increasing process variations and discriminating faulty and fault-free chips is becoming increasingly difficult. In this paper we evaluate a metric that uses wafer-level spatial information to identify faulty dice on a wafer. The metric is evaluated using industrial test data.

引用

页码：392 / 395

页数：4

共 12 条

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