Wetting properties and interfacial microstructures of Sn-Zn-xGa solders on Cu substrate

被引:46
作者
Chen, WenXue [1 ]
Xue, SongBai [1 ]
Wang, Hui [1 ]
机构
[1] Nanjing Univ Aeronaut & Astronaut, Coll Mat Sci & Technol, Nanjing 210016, Peoples R China
关键词
INTERMETALLIC COMPOUNDS; AG-CU; SOLDERABILITY; ALLOY;
D O I
10.1016/j.matdes.2009.10.053
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The wetting properties and interfacial microstructures of Sn-9Zn-xGa lead-free solders with Cu substrate were investigated. The wetting property is improved remarkably with the increase of Ga content in the Sn-9Zn lead-free solder. The lower surface tension, which results from the decrease of the oxidation of the Zn atoms owing to the formation of the Ga-rich protective film covered on the liquid solder, is the key reason for the better wettability. During soldering, the Cu5Zn8 compounds layer form at the interface of Sn-9Zn/Cu and the IMCs formed at the solder/Cu surface become much thicker when the Ga content is from 0.1 wt.% to 3 wt.%. However, neither Cu-Sn compounds nor Ga-rich phases are observed at the solder/Cu surface. (C) 2009 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2196 / 2200
页数:5
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