Scanning microscopy by mid-infrared near-field scattering

被引：44

作者：

Knoll, B ^{[1
]}

Keilmann, F ^{[1
]}

机构：

[1] Max Planck Inst Biochem, D-82152 Martinsried, Germany

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / 05期

关键词：

D O I：

10.1007/s003390050699

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We investigate mid-infrared imaging of dielectric and metallic surfaces by an "apertureless" SNOM approach of scattering CO2-laser radiation from an AFM tip. In the microscopic images we find and identify a new type of AFM-induced artifact (crosstalk via the tapping amplitude). Minimizing this by proper scan parameters we obtain evidence of true infrared contrast. The results demonstrate the material-sensitive potential of infrared-spectroscopic imaging and a spatial resolving power of better than 100 nm.

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页码：477 / 481

页数：5

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