An improved fault diagnosis algorithm based on path tracing with dynamic circuit extraction

被引：11

作者：

Shigeta, K ^{[1
]}

Ishiyama, T ^{[1
]}

机构：

[1] NEC Corp Ltd, Anal Technol Dev Div, Nakahara Ku, Kawasaki, Kanagawa 2118666, Japan

来源：

INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS | 2000年

关键词：

D O I：

10.1109/TEST.2000.894211

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

We have proposed a fault diagnosis algorithm based on path tracing which dynamically extracts partial circuits and traces error propagation paths from failing primary outputs to a fault origin. Logic inference and the rating procedures are improved, so that various fault modes such as stuck-at, open and bridge faults can be diagnosed. We have shown that the improved technique localizes faults effectively in a, reasonable time by applying it to several scan-based circuits: 20K-gate benchmark circuits (ISCAS'89), and 100K-and 2M-gate industrial circuits.

引用

页码：235 / 244

页数：10

共 17 条

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