Spectral characteristics of thin-film stacked-tandem solar modules

被引：15

作者：

Nakajima, A ^{[1
]}

Ichikawa, M ^{[1
]}

Sawada, T ^{[1
]}

Yoshimi, M ^{[1
]}

Yamamoto, K ^{[1
]}

机构：

[1] Kaneka Corp, Shiga 5200104, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2004年 / 43卷 / 10期

关键词：

spectral characterization; efficiency measurement; amorphous silicon; crystalline silicon film; multijunction; solar cell; large-area module;

D O I：

10.1143/JJAP.43.7296

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The device current-voltage (I-V) parameters of thin-film silicon stacked-tandem solar modules consisting of amorphous and microcrystalline silicon have been investigated under various spectral irradiance distributions. Spectrometric characterization method by the current mismatch perturbation has been developed using a large-area multisource solar simulator consisting of Xe lamps and halogen lamps with adequate optical filters. This method enables us to reveal the current-limited component cell and to specify the most suitable spectral distribution for tandem modules to obtain the best performance. Practical procedures for determining the irradiance level for a given single-source solar simulator have been demonstrated in order to carry out I-V measurement for tandem cells under nearly standard test conditions (STC). We have determined the differential of I-V parameters at various spectral distributions and found that the procedure using a reference tandem cell and its efficiency at STC could minimize variation from the true value even if the spectral distribution deviates from the reference.

引用

页码：7296 / 7302

页数：7

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