First results from the stockholm electron beam ion trap

被引：24
作者：
Bohm, S.
Enulescu, A.
Fritioff, T.
Orban, I.
Tashenov, S.
Schuch, R.
机构：
[1] Atomic Physics, Fysikum, Stockholm University
[2] NIPNE National Institute for Physics and Nuclear Engineering, Bukarest
[3] Gesellschaft für Schwerionenforschung (GSI)
来源：
HCI 2006: 13th International Conference on the Physics of Highly Charged Ions | 2007年 / 58卷
关键词：
D O I：
10.1088/1742-6596/58/1/067
中图分类号：
P1 [天文学];
学科分类号：
0704 ;
摘要：
A new laboratory for highly charged ions is being built up at Stockholm university. An electron beam ion trap (EBIT) (3T magnet, <= 30 keV electron beam) was installed. It is used for spectroscopic studies, precision mass measurements, electron ion collisions, and highly-charged ion surface studies. Here we report about a fast ion-extraction scheme from EBIT and first results using a time-of-flight detection as well as a LABVIEW based operational system of EBIT.
引用
收藏
页码：303 / 306
页数：4
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