Enhancing the Performance of Quantum-Dot Light-Emitting Diodes by Postmetallization Annealing

被引:32
作者
Su, Qiang [1 ]
Zhang, Heng [1 ]
Sun, Yizhe [1 ]
Sun, Xiao Wei [1 ]
Chen, Shuming [1 ]
机构
[1] Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China
基金
中国国家自然科学基金; 国家重点研发计划;
关键词
equantum-dots; light-emitting diodes; post-annealing; interlayer; exciton quenching; HIGH-EFFICIENCY; AUGER RECOMBINATION; EPITAXIAL LAYER; OHMIC CONTACTS; LUMINESCENCE; RESISTANCE; DEVICES; LEDS;
D O I
10.1021/acsami.8b08470
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The effect of postannealing on the device characteristics is systematically investigated. The external quantum efficiency (EQE) of blue quantum-dot light-emitting diodes (QLEDs) is significantly improved from 5.22 to 9.81% after postannealing. Similar results are obtained in green and red QLEDs, whose EQEs are enhanced from 11.47 and 13.60 to 15.57 and 16.59%, respectively. The annealed devices also exhibit a larger current density. The origin of efficiency improvement is thoroughly investigated. Our finding indicates that postannealing promotes the interfacial reaction of Al and ZnMgO and consequently leads to the metallization of the AlZnMgO contact and the formation of the AlOx interlayer. Because of the metallization of AlZnMgO, the contact resistance is effectively reduced, and thus the electron injection is enhanced. On the other hand, the formation of the AlOx interlayer can effectively suppress the quenching of excitons by the metal electrode. Because of the enhancement of electron injection and suppression of exciton quenching, the annealed blue, green, and red QLEDs exhibit a 1.9-, a 1.3-, and a 1.2-fold efficiency improvement, respectively. We envision the results offer a simple yet effective method to enhance the charge injection and the efficiency of QLED devices, which would promote the practical application of QLEDs.
引用
收藏
页码:23218 / 23224
页数:7
相关论文
共 28 条
[1]   High efficiency quantum dot light emitting diodes from positive aging [J].
Acharya, Krishna P. ;
Titov, Alexandre ;
Hyvonen, Jake ;
Wang, Chenggong ;
Tokarz, Jean ;
Holloway, Paul H. .
NANOSCALE, 2017, 9 (38) :14451-14457
[2]   Controlling the influence of Auger recombination on the performance of quantum-dot light-emitting diodes [J].
Bae, Wan Ki ;
Park, Young-Shin ;
Lim, Jaehoon ;
Lee, Donggu ;
Padilha, Lazaro A. ;
McDaniel, Hunter ;
Robel, Istvan ;
Lee, Changhee ;
Pietryga, Jeffrey M. ;
Klimov, Victor I. .
NATURE COMMUNICATIONS, 2013, 4
[3]   Controlled Alloying of the Core-Shell Interface in CdSe/CdS Quantum Dots for Suppression of Auger Recombination [J].
Bae, Wan Ki ;
Padilha, Lazaro A. ;
Park, Young-Shin ;
McDaniel, Hunter ;
Robel, Istvan ;
Pietryga, Jeffrey M. ;
Klimov, Victor I. .
ACS NANO, 2013, 7 (04) :3411-3419
[4]   Challenges and solutions for high-efficiency quantum dot-based LEDs [J].
Bozyigit, Deniz ;
Wood, Vanessa .
MRS BULLETIN, 2013, 38 (09) :731-736
[5]   Pure Blue and Highly Luminescent Quantum-Dot Light-Emitting Diodes with Enhanced Electron Injection and Exciton Confinement via Partially Oxidized Aluminum Cathode [J].
Cheng, Tai ;
Wang, Zhibin ;
Jin, Shengli ;
Wang, Fuzhi ;
Bai, Yiming ;
Feng, Haoxian ;
You, Baogui ;
Li, Yang ;
Hayat, Tasawar ;
Tan, Zhan'ao .
ADVANCED OPTICAL MATERIALS, 2017, 5 (11)
[6]   Quantum-Dot Light-Emitting Diodes for Large-Area Displays: Towards the Dawn of Commercialization [J].
Dai, Xingliang ;
Deng, Yunzhou ;
Peng, Xiaogang ;
Jin, Yizheng .
ADVANCED MATERIALS, 2017, 29 (14)
[7]   Solution-processed, high-performance light-emitting diodes based on quantum dots [J].
Dai, Xingliang ;
Zhang, Zhenxing ;
Jin, Yizheng ;
Niu, Yuan ;
Cao, Hujia ;
Liang, Xiaoyong ;
Chen, Liwei ;
Wang, Jianpu ;
Peng, Xiaogang .
NATURE, 2014, 515 (7525) :96-99
[8]   Mechanism of nonalloyed Al ohmic contacts to n-type ZnO:Al epitaxial layer [J].
Kim, HK ;
Seong, TY ;
Kim, KK ;
Park, SJ ;
Yoon, YS ;
Adesida, I .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2004, 43 (03) :976-979
[9]   Formation of low resistance nonalloyed Al/Pt ohmic contacts on n-type ZnO epitaxial layer [J].
Kim, HK ;
Kim, KK ;
Park, SJ ;
Seong, TY ;
Adesida, I .
JOURNAL OF APPLIED PHYSICS, 2003, 94 (06) :4225-4227
[10]   Low resistance Ti/Au contacts to amorphous gallium indium zinc oxides [J].
Kim, Hyunsoo ;
Kim, Kyoung-Kook ;
Lee, Sung-Nam ;
Ryou, Jae-Hyun ;
Dupuis, Russell D. .
APPLIED PHYSICS LETTERS, 2011, 98 (11)