Stability and break-up of thin liquid films on patterned and structured surfaces

被引:41
|
作者
Ajaev, Vladimir S. [1 ]
Gatapova, Elizaveta Ya. [2 ]
Kabov, Oleg A. [2 ,3 ]
机构
[1] So Methodist Univ, Dept Math, Dallas, TX 75275 USA
[2] Russian Acad Sci, Inst Thermophys, Novosibirsk 630090, Russia
[3] Natl Tomsk Polytech Res Univ, Tomsk 634050, Russia
基金
俄罗斯科学基金会;
关键词
Stability; Disjoining pressure; Marangoni effect; Superhydrophobic surfaces; Floquet theory; Lubrication approximation; CONTACT-ANGLE HYSTERESIS; NONLINEAR STABILITY; SPONTANEOUS RUPTURE; SELF-ORGANIZATION; INSTABILITY; DRIVEN; DYNAMICS; TENSION; CASSIE; DEFORMATION;
D O I
10.1016/j.cis.2015.11.011
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Solid surfaces with chemical patterning or topographical structure have attracted attention due to many potential applications such as manufacture of flexible electronics, microfluidic devices, microscale cooling systems, as well as development of self-cleaning, antifogging, and antimicrobial surfaces. In many configurations involving patterned or structured surfaces, liquid films are in contact with such solid surfaces and the issue of film stability becomes important. Studies of stability in this context have been largely focused on specific applications and often not connected to each other. The purpose of the present review is to provide a unified view of the topic of stability and rupture of liquid films on patterned and structured surfaces, with particular focus on common mathematical methods, such as lubrication approximation for the liquid flow, bifurcation analysis, and Floquet theory, which can be used for a wide variety of problems. The physical mechanisms of the instability discussed include disjoining pressure, thermocapillarity, and classical hydrodynamic instability of gravity-driven flows. Motion of a contact line formed after the film rupture is also discussed, with emphasis on how the receding contact angle is expected to depend on the small-scale properties of the substrate. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:92 / 104
页数:13
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