Al0.68Sc0.32N Lamb wave resonators with electromechanical coupling coefficients near 10.28%

被引:57
作者
Esteves, Giovanni [1 ]
Young, Travis R. [1 ]
Tang, Zichen [2 ]
Yen, Sean [1 ]
Bauer, Todd M. [1 ]
Henry, Michael D. [1 ]
Olsson, Roy H., III [2 ]
机构
[1] Sandia Natl Labs, MESA Complex, Albuquerque, NM 87123 USA
[2] Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USA
关键词
D O I
10.1063/5.0047647
中图分类号
O59 [应用物理学];
学科分类号
摘要
Aluminum scandium nitride (Al1-xScxN/AlScN) (x = 0.32) Lamb wave resonators (LWR) have been fabricated and tested to demonstrate electromechanical coupling coefficients (k(t)(2)) in excess of 10%. The resonators exhibited an average k(t)(2) and unloaded quality factor (Q(u)) of 10.28% and 711, respectively, when calculated from the measured data. Applying the Butterworth Van-Dyke (BVD) model to the measured data enabled the extraction of the resonator's lumped element parameters to calculate the motional quality factor (Q(m)), which neglects the contributions of the electrical traces. For the best measured resonator response, results from the BVD model showed a Q(m) of 1184 and a resulting figure-of-merit (FOM = K-2 center dot Q(m)) of 100. Comparing the response of similar AlScN and AlN resonators shows that the AlScN LWR has a significantly lower motional resistance (R-m), suggesting that AlScN has a strong potential for use in piezoelectric microelectromechanical oscillators.
引用
收藏
页数:5
相关论文
共 21 条
[1]   Influence of scandium concentration on power generation figure of merit of scandium aluminum nitride thin films [J].
Akiyama, Morito ;
Umeda, Keiichi ;
Honda, Atsushi ;
Nagase, Toshimi .
APPLIED PHYSICS LETTERS, 2013, 102 (02)
[2]  
[Anonymous], 2011, Microwave Engineering
[3]   Piezoelectric coefficients and spontaneous polarization of ScAlN [J].
Caro, Miguel A. ;
Zhang, Siyuan ;
Riekkinen, Tommi ;
Ylilammi, Markku ;
Moram, Michelle A. ;
Lopez-Acevedo, Olga ;
Molarius, Jyrki ;
Laurila, Tomi .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2015, 27 (24)
[4]  
Chen L. F, 2004, MicrowaveElectronics: Measurement and Materials Characterization
[5]  
Colombo L., 2017, IEEE INT ULTRASON S, P1
[6]  
Henry M.D., 2015 IEEE 65 EL COMP
[7]   Reactive sputter deposition of piezoelectric Sc0.12Al0.88N for contour mode resonators [J].
Henry, Michael D. ;
Young, Travis R. ;
Douglas, Erica A. ;
Griffin, Benjamin A. .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2018, 36 (03)
[8]   ScAlN etch mask for highly selective silicon etching [J].
Henry, Michael David ;
Young, Travis R. ;
Griffin, Ben .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2017, 35 (05)
[9]   Uncertainty analysis of the transmission-type measurement of Q-factor [J].
Kajfez, D ;
Chebolu, S ;
Abdul-Gaffoor, MR ;
Kishk, AA .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1999, 47 (03) :367-371
[10]   Evidence of Smaller 1/F Noise in AlScN-Based Oscillators Compared to AlN-Based Oscillators [J].
Lozzi, Andrea ;
Liffredo, Marco ;
Yen, Ernest Ting-Ta ;
Segovia-Fernandez, Jeronimo ;
Villanueva, Luis Guillermo .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2020, 29 (03) :306-312