Insights into the electronic structure of ceramics through quantitative analysis of valence electron energy-loss spectroscopy

被引:0
|
作者
Müllejans, H
French, RH
机构
[1] Commiss European Communities, Joint Res Ctr, Inst Adv Mat, NL-1755 ZG Petten, Netherlands
[2] Max Planck Inst Met Res, D-70174 Stuttgart, Germany
[3] DuPont Co Inc, Cent Res, Expt Stn E356384, Wilmington, DE 19880 USA
关键词
scanning transmission electron microscope; valence electron energy-loss spectroscopy; ceramics; electronic structure; optical properties; data analysis; interband transition strength; quantitative analysis;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Valence electron energy-loss (VEEL) spectroscopy was performed on six ceramic materials in a dedicated scanning transmission electron microscope (STEM). Quantitative analysis of these data is described yielding access to the complex optical properties and the electronic structure of the materials. Comparisons are made on the basis of the interband transition strength describing transitions between occupied states in the valence band and empty states in the conduction band. This proves that the quantitative analysis of VEEL data is a competitive and complementary method to be considered when investigating the electronic structure of materials. Possibilities for improvement and extension of the analysis are discussed extensively.
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页码:297 / 306
页数:10
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