Insights into the electronic structure of ceramics through quantitative analysis of valence electron energy-loss spectroscopy

被引:0
作者
Müllejans, H
French, RH
机构
[1] Commiss European Communities, Joint Res Ctr, Inst Adv Mat, NL-1755 ZG Petten, Netherlands
[2] Max Planck Inst Met Res, D-70174 Stuttgart, Germany
[3] DuPont Co Inc, Cent Res, Expt Stn E356384, Wilmington, DE 19880 USA
关键词
scanning transmission electron microscope; valence electron energy-loss spectroscopy; ceramics; electronic structure; optical properties; data analysis; interband transition strength; quantitative analysis;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Valence electron energy-loss (VEEL) spectroscopy was performed on six ceramic materials in a dedicated scanning transmission electron microscope (STEM). Quantitative analysis of these data is described yielding access to the complex optical properties and the electronic structure of the materials. Comparisons are made on the basis of the interband transition strength describing transitions between occupied states in the valence band and empty states in the conduction band. This proves that the quantitative analysis of VEEL data is a competitive and complementary method to be considered when investigating the electronic structure of materials. Possibilities for improvement and extension of the analysis are discussed extensively.
引用
收藏
页码:297 / 306
页数:10
相关论文
共 50 条
[11]   Characterization of the electronic excitations in Alq3 using electron energy-loss spectroscopy [J].
Knupfer, M. .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2009, 94 (01) :31-34
[12]   Electronic structure of MgS and MgYb2S4: Electron Energy-Loss Spectroscopy and self-consistent multiple scattering calculations [J].
Moreno, M. S. ;
Urones-Garrote, Esteban ;
Otero-Diaz, L. C. .
MICRON, 2015, 73 :9-14
[13]   Electronic structure of BaSnO3 investigated by high-energy-resolution electron energy-loss spectroscopy and ab initio calculations [J].
Yun, Hwanhui ;
Topsakal, Mehmet ;
Prakash, Abhinav ;
Ganguly, Koustav ;
Leighton, Chris ;
Jalan, Bharat ;
Wentzcovitch, Renata M. ;
Mkhoyan, K. Andre ;
Jeong, Jong Seok .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2018, 36 (03)
[14]   Electronic structure and electron energy-loss spectra of Sr0.35CoO2 [J].
Xiao, RJ ;
Yang, HX ;
Xu, LF ;
Zhang, HR ;
Shi, YG ;
Li, JQ .
SOLID STATE COMMUNICATIONS, 2005, 135 (11-12) :687-691
[15]   High energy-resolution electron energy-loss Spectroscopy study of electronic structures of barium titanate nanocrystals [J].
Suzuki, K ;
Terauchi, M ;
Uemichi, Y ;
Kijima, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (10) :7593-7597
[16]   Electronic structure investigations of Ni and Cr films on (100)SrTiO3 substrates using electron energy-loss spectroscopy [J].
van Benthem, K ;
Scheu, C ;
Sigle, W ;
Rühle, M .
ZEITSCHRIFT FUR METALLKUNDE, 2002, 93 (05) :362-371
[17]   Electron energy-loss near-edge structure - a tool for the investigation of electronic structure on the nanometre scale [J].
Keast, VJ ;
Scott, AJ ;
Brydson, R ;
Williams, DB ;
Bruley, J .
JOURNAL OF MICROSCOPY, 2001, 203 :135-175
[18]   Atomic-Scale Electronic Characterization of Defects in Silicon Carbide Nanowires by Electron Energy-Loss Spectroscopy [J].
Luna, Lunet E. ;
Gardner, David ;
Radmilovic, Velimir ;
Maboudian, Roya ;
Carraro, Carlo .
JOURNAL OF PHYSICAL CHEMISTRY C, 2018, 122 (22) :12047-12051
[19]   Nanoscale probing of bandgap states on oxide particles using electron energy-loss spectroscopy [J].
Liu, Qianlang ;
March, Katia ;
Crozier, Peter A. .
ULTRAMICROSCOPY, 2017, 178 :2-11
[20]   Retrieving the energy-loss function from valence electron energy-loss spectrum: Separation of bulk-, surface-losses and Cherenkov radiation [J].
Meng, Qingping ;
Wu, Lijun ;
Xin, Huolin L. ;
Zhu, Yimei .
ULTRAMICROSCOPY, 2018, 194 :175-181