Microscopy Study of Structural Evolution in Epitaxial LiCoO2 Positive Electrode Films during Electrochemical Cycling
被引:45
作者:
Tan, Haiyan
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机构:
Theiss Res, La Jolla, CA 92037 USA
NIST, Mat Measurement Lab, Gaithersburg, MD 20899 USATheiss Res, La Jolla, CA 92037 USA
Tan, Haiyan
[1
,2
]
Takeuchi, Saya
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机构:
NIST, Mat Measurement Lab, Gaithersburg, MD 20899 USATheiss Res, La Jolla, CA 92037 USA
Takeuchi, Saya
[2
]
Bharathi, K. Kamala
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机构:
NIST, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Univ Maryland, Dept Mat Sci & Engn, College Pk, MD 20742 USATheiss Res, La Jolla, CA 92037 USA
Bharathi, K. Kamala
[2
,3
]
Takeuchi, Ichiro
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机构:
Univ Maryland, Dept Mat Sci & Engn, College Pk, MD 20742 USATheiss Res, La Jolla, CA 92037 USA
Takeuchi, Ichiro
[3
]
Bendersky, Leonid A.
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NIST, Mat Measurement Lab, Gaithersburg, MD 20899 USATheiss Res, La Jolla, CA 92037 USA
Bendersky, Leonid A.
[2
]
机构:
[1] Theiss Res, La Jolla, CA 92037 USA
[2] NIST, Mat Measurement Lab, Gaithersburg, MD 20899 USA
[3] Univ Maryland, Dept Mat Sci & Engn, College Pk, MD 20742 USA
The evolution of interface between the epitaxial thin film LiCoO2 (LCO) electrode and, liquid electrolyte and inside the LCO film during electrochemical cycling has been analyzed by high resolution scanning transmission electron microscopy. Relaxation of sharp translational domain boundaries with mismatched layers of CoO2 octahedra occurs during cycling and results in formation of continuous CoO2 layers across the boundaries. The original trigonal layered structure of LiCoO2 tends to change into a spinel structure at the electrode/electrolyte interface after significant extraction of Li from LCO. This change is more pronounced at 4.2 V peak of CV, indicating lower stability of the layered LCO structure near its surface after Li is extracted above 60%. The transformed structure is identified to be close to Co3O4, with Co both on tetrahedral and octahedral sites, rather than to LiCo2O4 as it was suggested in earlier publications. Electron energy-loss spectroscopy measurements also show that Co ions oxidation state is reduced to mixed valence state Co2+/Co3+ during the structure changes to spinel rather than oxidized.
机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Balke, N.
;
Jesse, S.
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Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Jesse, S.
;
Morozovska, A. N.
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Natl Acad Sci Ukraine, Inst Semicond Phys, UA-03028 Kiev, UkraineOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Morozovska, A. N.
;
Eliseev, E.
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Natl Acad Sci Ukraine, Inst Problems Mat Sci, UA-03142 Kiev, UkraineOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Eliseev, E.
;
Chung, D. W.
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Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Chung, D. W.
;
Kim, Y.
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Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Kim, Y.
;
Adamczyk, L.
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Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Adamczyk, L.
;
Garcia, R. E.
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Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Garcia, R. E.
;
Dudney, N.
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Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Dudney, N.
;
Kalinin, S. V.
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Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
机构:
NIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Debnath, Ratan
;
Xie, Ting
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机构:
NIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Univ Maryland, Dept Elect & Comp Engn, College Pk, MD 20742 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Xie, Ting
;
Wen, Baomei
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机构:
NIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
N5 Sensors Inc, Rockville, MD 20852 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Wen, Baomei
;
Li, Wei
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机构:
NIST, Semicond & Dimens Metrol Div, Phys Measurement Lab, Gaithersburg, MD 20899 USA
Peking Univ, Key Lab Phys & Chem Nano Devices, Beijing 100871, Peoples R ChinaNIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Li, Wei
;
Ha, Jong Y.
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机构:
NIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Univ Maryland, Inst Res Elect & Appl Phys, College Pk, MD 20742 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Ha, Jong Y.
;
Sullivan, Nichole F.
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机构:
N5 Sensors Inc, Rockville, MD 20852 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Sullivan, Nichole F.
;
Nguyen, Nhan V.
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NIST, Semicond & Dimens Metrol Div, Phys Measurement Lab, Gaithersburg, MD 20899 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Nguyen, Nhan V.
;
Motayed, Abhishek
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机构:
NIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Univ Maryland, Inst Res Elect & Appl Phys, College Pk, MD 20742 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Balke, N.
;
Jesse, S.
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h-index: 0
机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Jesse, S.
;
Morozovska, A. N.
论文数: 0引用数: 0
h-index: 0
机构:
Natl Acad Sci Ukraine, Inst Semicond Phys, UA-03028 Kiev, UkraineOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Morozovska, A. N.
;
Eliseev, E.
论文数: 0引用数: 0
h-index: 0
机构:
Natl Acad Sci Ukraine, Inst Problems Mat Sci, UA-03142 Kiev, UkraineOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Eliseev, E.
;
Chung, D. W.
论文数: 0引用数: 0
h-index: 0
机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Chung, D. W.
;
Kim, Y.
论文数: 0引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Kim, Y.
;
Adamczyk, L.
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h-index: 0
机构:
Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Adamczyk, L.
;
Garcia, R. E.
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h-index: 0
机构:
Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Garcia, R. E.
;
Dudney, N.
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Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Dudney, N.
;
Kalinin, S. V.
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h-index: 0
机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
机构:
NIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Debnath, Ratan
;
Xie, Ting
论文数: 0引用数: 0
h-index: 0
机构:
NIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Univ Maryland, Dept Elect & Comp Engn, College Pk, MD 20742 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Xie, Ting
;
Wen, Baomei
论文数: 0引用数: 0
h-index: 0
机构:
NIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
N5 Sensors Inc, Rockville, MD 20852 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Wen, Baomei
;
Li, Wei
论文数: 0引用数: 0
h-index: 0
机构:
NIST, Semicond & Dimens Metrol Div, Phys Measurement Lab, Gaithersburg, MD 20899 USA
Peking Univ, Key Lab Phys & Chem Nano Devices, Beijing 100871, Peoples R ChinaNIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Li, Wei
;
Ha, Jong Y.
论文数: 0引用数: 0
h-index: 0
机构:
NIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Univ Maryland, Inst Res Elect & Appl Phys, College Pk, MD 20742 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Ha, Jong Y.
;
Sullivan, Nichole F.
论文数: 0引用数: 0
h-index: 0
机构:
N5 Sensors Inc, Rockville, MD 20852 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Sullivan, Nichole F.
;
Nguyen, Nhan V.
论文数: 0引用数: 0
h-index: 0
机构:
NIST, Semicond & Dimens Metrol Div, Phys Measurement Lab, Gaithersburg, MD 20899 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Nguyen, Nhan V.
;
Motayed, Abhishek
论文数: 0引用数: 0
h-index: 0
机构:
NIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Univ Maryland, Inst Res Elect & Appl Phys, College Pk, MD 20742 USANIST, Mat Sci & Engn Lab, Mat Measurement Lab, Gaithersburg, MD 20899 USA