Optical beam deflection approach for studying ion-exchange reactions occurring at a single ion-exchange resin particle

被引:2
|
作者
Wu, Xing-Zheng
Tsuji, Yumiko
Teramae, Norio
机构
[1] Univ Fukui, Fac Engn, Dept Mat Sci & Engn, Fukui 9108507, Japan
[2] Tohoku Univ, Grad Sch Sci, Dept Chem, Sendai, Miyagi 980, Japan
关键词
optical beam deflection; single particle; ion exchanger; reaction; microscope;
D O I
10.1016/j.reactfunctpolym.2006.10.002
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
The optical beam deflection method was applied for exploring chemical reactions occurring at a single particle. A probe beam from a diode laser was introduced into a microscope, and focused to the vicinity of a particle. When a chemical reaction occurs at the surface of the particle, concentration gradients exist in the vicinity of the particle due to the diffusion of chemical species involved in the reaction. Ion exchange reactions occurring at a single particle of ion exchangers were used as model systems. The results showed that the tendency of change in the OBD signal with time is opposite of that seen in the reverse ion exchange reactions, both theoretically and experimentally. Also, the experimental results indicated that the concentration gradients changed with time in the diffusion layer around the particles, implying that the actual reaction-rate determining step was not the particle diffusion but film diffusion. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:113 / 119
页数:7
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