Reconstructing dual-phase nanometer scale grains within a pearlitic steel tip in 3D through 4D-scanning precession electron diffraction tomography and automated crystal orientation mapping

被引:7
作者
Harrison, Patrick [1 ]
Zhou, Xuyang [2 ]
Das, Saurabh Mohan [2 ]
Lhuissier, Pierre [1 ]
Liebscher, Christian H. [2 ]
Herbig, Michael [2 ]
Ludwig, Wolfgang [3 ,4 ]
Rauch, Edgar F. [1 ]
机构
[1] Univ Grenoble Alpes, CNRS, Grenoble INP, SIMaP, F-38000 Grenoble, France
[2] Max Planck Inst Eisenforsch GmbH, Max-Planck-Str 1, D-40237 Dusseldorf, Germany
[3] ESRF European Synchrotron, Grenoble, France
[4] MATEIS, INSA Lyon, CNRS, UMR 5510, 25 Jean Capelle, F-69621 Villeurbanne, France
关键词
Transmission electron microscopy (TEM); Scanning precession electron diffraction; (SPED); Automated crystal orientation mapping; (ACOM); Diffraction tomography; Pearlitic steel; Nanoscale grains; MICROSCOPY;
D O I
10.1016/j.ultramic.2022.113536
中图分类号
TH742 [显微镜];
学科分类号
摘要
The properties of polycrystalline materials are related to their microstructures and hence a complete description, including size, shape, and orientation of the grains, is necessary to understand the behavior of materials. Here, we use Scanning Precession Electron Diffraction (SPED) in the Transmission Electron Microscope (TEM) combined with a tilt series to reconstruct individual grains in 3D within a polycrystalline dual-phase cold wire-drawn pearlitic steel sample. Nanoscale ferrite grains and intragranular cementite particles were indexed using an Automated Crystallographic Orientation Mapping (ACOM) tool for each tilt dataset. The grain orientations were tracked through the tilt datasets and projections of the individual grains were reconstructed from the diffraction data using an orientation-specific Virtual Dark Field (VDF) approach for tomographic reconstruction. The algorithms used to process and reconstruct such datasets are presented. These algorithms represent an extension to the ACOM approach that may be straightforwardly applied to other multi-phase polycrystalline materials to enable 3D spatial and orientation reconstructions.
引用
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页数:8
相关论文
共 49 条
[1]   Nanocrystal segmentation in scanning precession electron diffraction data [J].
Bergh, T. ;
Johnstone, D. N. ;
Crout, P. ;
Hogas, S. ;
Midgley, P. A. ;
Holmestad, R. ;
Vullum, P. E. ;
Van Helvoort, A. T. J. .
JOURNAL OF MICROSCOPY, 2020, 279 (03) :158-167
[2]   High-Energy X-Ray Diffraction Microscopy in Materials Science [J].
Bernier, Joel V. ;
Suter, Robert M. ;
Rollett, Anthony D. ;
Almer, Jonathan D. .
ANNUAL REVIEW OF MATERIALS RESEARCH, VOL 50, 2020, 2020, 50 :395-436
[3]   X-ray diffraction microscopy: emerging imaging techniques for nondestructive analysis of crystalline materials from the millimetre down to the nanometre scale [J].
Borbely, Andras ;
Kaysser-Pyzalla, Anke R. .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2013, 46 :295-296
[4]   Orientation gradients and geometrically necessary dislocations in ultrafine grained dual-phase steels studied by 2D and 3D EBSD [J].
Calcagnotto, Marion ;
Ponge, Dirk ;
Demir, Eralp ;
Raabe, Dierk .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2010, 527 (10-11) :2738-2746
[5]  
Carpenter G.J.C., 2012, Micros, Today Off., V20, P52, DOI [10.1017/S1551929512000697, DOI 10.1017/S1551929512000697, 10.1017/s1551929512000697]
[6]   Applications of electron nanodiffraction [J].
Cowley, JM .
MICRON, 2004, 35 (05) :345-360
[7]   On Implementing 2D Rectangular Assignment Algorithms [J].
Crouse, David F. .
IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 2016, 52 (04) :1679-1696
[8]   RECONSTRUCTION OF 3 DIMENSIONAL STRUCTURE FROM PROJECTIONS AND ITS APPLICATION TO ELECTRON MICROSCOPY [J].
CROWTHER, RA ;
DEROSIER, DJ ;
KLUG, A .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1970, 317 (1530) :319-&
[9]   Orientation imaging microscopy for the transmission electron microscope [J].
Dingley, David J. .
MICROCHIMICA ACTA, 2006, 155 (1-2) :19-29
[10]   Scanning precession electron tomography for three-dimensional nanoscale orientation imaging and crystallographic analysis [J].
Eggeman, Alexander S. ;
Krakow, Robert ;
Midgley, Paul A. .
NATURE COMMUNICATIONS, 2015, 6