Investigation of nanocrystalline diamond films grown on silicon and glass at substrate temperature below 400 °C

被引:48
作者
Potocky, S.
Kromka, A.
Potmesil, J.
Remes, Z.
Vorlicek, V.
Vanecek, M.
Michalka, M.
机构
[1] Acad Sci Czech Republic, Inst Phys, CZ-16253 Prague 6, Czech Republic
[2] Slovak Univ Technol Bratislava, Dept Microelect, Bratislava 81219, Slovakia
[3] Acad Sci Czech Republic, Inst Phys, CZ-18221 Prague 8, Czech Republic
[4] Ctr Int Laser, Bratislava 81219, Slovakia
关键词
nanocrystalline diamond; low temperature growth; SEM;
D O I
10.1016/j.diamond.2006.11.028
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present investigation of nanocrystalline diamond films deposited in a wide temperature range. The nanocrystalline diamond films were grown on silicon and glass substrates from hydrogen based gas mixture (methane and hydrogen) by microwave plasma CVD process. Film composition, nano-grain size and surface morphology were investigated by Raman spectroscopy and scanning electron microscopy. All samples showed diamond characteristic line centred at 1332 cm(-1) in the Raman spectrum. Nanocrystalline diamond layers revealed high surface flatness (under 10 nm) with crystal size below 60 rim. Surface morphology of grown films was well homogeneous over glass substrates due to used mechanical seeding procedure. Very thin films (40 nm) were successfully grown on glass slides (i.e. standard size 1 x 3 ''). An increase in delay time was observed when the substrate temperature was decreased. A possible origin for this behaviour was discussed. (C) 2006 Elsevier B.V. All fights reserved.
引用
收藏
页码:744 / 747
页数:4
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