MAGFET based current sensing for power integrated circuit

被引:13
作者
Busatto, G
La Capruccia, R
Iannuzzo, F
Velardi, F
Roncella, R
机构
[1] Univ Cassino, DAEIMI, Dept Automat Electromagnet Informat Engn & Ind Ma, I-03043 Cassino, Italy
[2] Univ Pisa, Dept Informat Engn, Pisa, Italy
关键词
D O I
10.1016/S0026-2714(03)00024-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new on-chip non-invasive integrated current sensing, compatible with standard CMOS technology, has been developed, using a 1.2 mum BiCMOS ALCATEL technology. to sense the current in the drain side of a power MOSFET. The circuit is based on a split-drain magnetic sensor. implemented on the same chip of an integrated gate driver for a power MOSFET. A CMOS biasing circuit with a differential current output is also developed. The simulation results of the current sensing show a conversion gain of 1.25 mV/mT. (C) 2003 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:577 / 583
页数:7
相关论文
共 8 条
[1]  
[Anonymous], 1998, MEDICI USERS MANUAL
[2]  
CORDONNIER CE, 1986, ELECTRONIQUE PUISSAN, V18, P34
[3]  
HO LA, 2001, SOLID STATE CIRC, V36
[4]  
KURATLI C, 1996, IEEE SOLID STATE CIR, V31
[5]  
LIU SI, 1999, IEEE T ELECT DEV, V46
[6]   UNIVERSAL MAGNETOOPERATIONAL AMPLIFIER (MOP) [J].
MAENAKA, K ;
OKADA, H ;
NAKAMURA, T .
SENSORS AND ACTUATORS A-PHYSICAL, 1990, 22 (1-3) :807-811
[7]   Integrated current sensing device for micro IDDQ test [J].
Nose, K ;
Sakurai, T .
SEVENTH ASIAN TEST SYMPOSIUM (ATS'98), PROCEEDINGS, 1998, :323-326
[8]  
VONKLUGE JW, 1999, IEEE T ELECTRON DEV, P46