Determination of surface morphology and electrical properties of MoO3 layer deposited on GaAs substrate with RF magnetron sputtering

被引:15
作者
Cetinkaya, Caglar [1 ,2 ]
Cokduygulular, Erman [3 ]
Ozen, Yunus [2 ,4 ]
Candan, Idris [5 ]
Kinaci, Baris [1 ,2 ]
Ozcelik, Suleyman [2 ,6 ]
机构
[1] Istanbul Univ, Fac Sci, Dept Phys, TR-34134 Istanbul, Turkey
[2] Gazi Univ, Photon Res Ctr, TR-06500 Ankara, Turkey
[3] Istanbul Univ Cerrahpasa, Fac Engn, Engn Sci, TR-34320 Istanbul, Turkey
[4] Gazi Univ, Fac Sci, Dept Phys, TR-06500 Ankara, Turkey
[5] Kocaeli Univ, Dept Phys, TR-41001 Kocaeli, Turkey
[6] Gazi Univ, Dept Photon, TR-06500 Ankara, Turkey
关键词
GAS-SENSING PROPERTIES; THIN-FILMS; SOLAR-CELLS; VOLTAGE; NANOCOMPOSITES; PERFORMANCE; INTERFACES; STABILITY; THICKNESS; TRANSPORT;
D O I
10.1007/s10854-021-05863-0
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the effects of the substrate temperature on the surface morphology of Molybdenum tri-oxide (MoO3) thin films and the electrically detailed examination of Au/MoO3/n-GaAs MOS heterojunction structure with the best homogeneity. MoO3 thin film was deposited both on soda-lime silicate glass as a thin film and n-type and (100) oriented GaAs substrates using RF magnetron sputtering method at substrate temperatures of room temperature, 100 degrees C, 200 degrees C and 300 degrees C. Surface morphology of the MoO3 thin films were investigated by utilizing atomic force microscopy (AFM) and scanning electron microscopy (SEM) measurements. AFM and SEM results have shown that MoO3 thin film with substrate temperature of 200 degrees C has the lowest surface roughness and the homogeneity of the film structures significantly enhances with increasing substrate temperature up to 200 degrees C. An inclement in roughness of thin film structure was detected at higher temperature than 200 degrees C due to the deterioration of homogeneity. Therefore, we primarily focused on the MoO3 thin films produced at the substrate temperature of 200 degrees C to examine the electrical properties of Au/MoO3/n-GaAs MOS heterojunction device. In order to determine the electrical properties, temperature dependent I - V measurements were performed in between 200 and 400 K by steps of 25 K. The fundamental electrical parameters such as saturation current (I-0), ideality factor (n), and barrier height (phi(0)) were calculated by analyzing the forward bias I-V curves at different temperatures. The series resistance (R-s) values of the device were also determined using the plot of structure resistance (R-i) vs applied bias voltage (V-i), Thermionic Emission Theory and Cheung and Cheung methods. The R-s value of Au/MoO3/n-GaAs MOS heterojunction device shows an abnormal behavior of up to 350 K, which is the critical temperature value and tends to increase with increasing temperature. Above the critical temperature value, it exhibits ideal behavior.
引用
收藏
页码:12330 / 12339
页数:10
相关论文
共 54 条
[1]   Iteratively derived optical constants of MoO3 polycrystalline thin films prepared by CVD [J].
Abdellaoui, A ;
Leveque, G ;
Donnadieu, A ;
Bath, A ;
Bouchikhi, B .
THIN SOLID FILMS, 1997, 304 (1-2) :39-44
[2]   Substrate temperature induced effect on microstructure, optical and photocatalytic activity of ultrasonic spray pyrolysis deposited MoO3 thin films [J].
Alex, Kevin, V ;
Jayakrishnan, A. R. ;
Kumar, Ajeesh S. ;
Ibrahim, A. Sulthan ;
Kamakshi, K. ;
Silva, J. P. B. ;
Sekhar, K. C. ;
Gomes, M. J. M. .
MATERIALS RESEARCH EXPRESS, 2019, 6 (06)
[3]   Temperature-dependent interface stability of MoO3/GaAs(001) hybrid structures [J].
Ashraf, Tanveer ;
Sarkar, Anirban ;
Grafeneder, Wolfgang ;
Koch, Reinhold .
JOURNAL OF APPLIED PHYSICS, 2018, 124 (21)
[4]   Enhanced Charge Carrier Mobility in Two-Dimensional High Dielectric Molybdenum Oxide [J].
Balendhran, Sivacarendran ;
Deng, Junkai ;
Ou, Jian Zhen ;
Walia, Sumeet ;
Scott, James ;
Tang, Jianshi ;
Wang, Kang L. ;
Field, Matthew R. ;
Russo, Salvy ;
Zhuiykov, Serge ;
Strano, Michael S. ;
Medhekar, Nikhil ;
Sriram, Sharath ;
Bhaskaran, Madhu ;
Kalantar-zadeh, Kourosh .
ADVANCED MATERIALS, 2013, 25 (01) :109-114
[5]   Hole Selective MoOx Contact for Silicon Solar Cells [J].
Battaglia, Corsin ;
Yin, Xingtian ;
Zheng, Maxwell ;
Sharp, Ian D. ;
Chen, Teresa ;
McDonnell, Stephen ;
Azcatl, Angelica ;
Carraro, Carlo ;
Ma, Biwu ;
Maboudian, Roya ;
Wallace, Robert M. ;
Javey, Ali .
NANO LETTERS, 2014, 14 (02) :967-971
[6]  
Bessonov AA, 2015, NAT MATER, V14, P199, DOI [10.1038/NMAT4135, 10.1038/nmat4135]
[7]   Molybdenum oxide MoOx: A versatile hole contact for silicon solar cells [J].
Bullock, James ;
Cuevas, Andres ;
Allen, Thomas ;
Battaglia, Corsin .
APPLIED PHYSICS LETTERS, 2014, 105 (23)
[8]   Structural transformations in MoOx thin films grown by pulsed laser deposition [J].
Camacho-López, MA ;
Escobar-Alarcón, L ;
Haro-Poniatowski, E .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2004, 78 (01) :59-65
[9]   Crystalline Molybdenum Oxide Thin-Films for Application as Interfacial Layers in Optoelectronic Devices [J].
Cauduro, Andre L. F. ;
Dos Reis, Roberto ;
Chen, Gong ;
Schmid, Andreas K. ;
Methivier, Christophe ;
Rubahn, Horst-Gunter ;
Bossard-Giannesini, Leo ;
Cruguel, Herve ;
Witkowski, Nadine ;
Madsen, Morten .
ACS APPLIED MATERIALS & INTERFACES, 2017, 9 (08) :7717-7724
[10]   Post-deposition annealing control of phase and texture for the sputtered MoO3 films [J].
Chang, Wei-Che ;
Qi, Xiaoding ;
Kuo, Jui-Chao ;
Lee, Shih-chin ;
Ng, Sio-Kei ;
Chen, Delphic .
CRYSTENGCOMM, 2011, 13 (16) :5125-5132