A review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements

被引：79

作者：

Gan, Yang ^{[1
]}

机构：

[1] Univ Newcastle, Sch Engn, Callaghan, NSW 2308, Australia

[2] Univ Melbourne, Dept Chem & Biomol Engn, Melbourne, Vic 3010, Australia

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2007年 / 78卷 / 08期

关键词：

GOLD NANOPARTICLE; MICROSCOPE; RESOLUTION; PARTICLE;

D O I：

10.1063/1.2754076

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications. (c) 2007 American Institute of Physics.

引用

页数：8

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