Single event transient pulsewidth measurements using a variable temporal latch technique

被引：98
作者：
Eaton, P [1 ]
Benedetto, J
Mavis, D
Avery, K
Sibley, M
Gadlage, M
Turflinger, T
机构：
[1] ATK Mission Res, Albuquerque, NM 87110 USA
[2] NAVSEA Crane, Crane, IN 47522 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2004年 / 51卷 / 06期
关键词：
D O I：
10.1109/TNS.2004.840020
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new test structure was designed for measuring the pulsewidths of transients created by SETs. Experimental data was gathered using heavy ions from LETs of 11.5 to 84 MeV - cm(2)/mg. The pulsewidths of SETs generated using heavy ions are measured using a variable temporal latch. Our SET's widths at low LETs agree exceptionally well with previous localized beam measurements.
引用
收藏
页码：3365 / 3368
页数：4
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