Electrical transport mechanisms in a-Si:H/c-Si heterojunction solar cells

被引:99
作者
Schulze, T. F. [1 ]
Korte, L. [1 ]
Conrad, E. [1 ]
Schmidt, M. [1 ]
Rech, B. [1 ]
机构
[1] Helmholtz Zentrum Berlin Mat & Energie, Dept Silicon Photovolta, D-12489 Berlin, Germany
关键词
amorphous semiconductors; buffer layers; carrier lifetime; elemental semiconductors; hydrogen; minority carriers; photoelectron spectra; semiconductor heterojunctions; semiconductor thin films; silicon; solar cells; surface photovoltage; P-N-JUNCTIONS; CARRIER TRANSPORT; AMORPHOUS-SILICON; BAND OFFSETS; RECOMBINATION; INTERFACE; SEMICONDUCTORS; CURRENTS; DEFECTS; STATES;
D O I
10.1063/1.3267316
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present temperature-dependent measurements of I-V curves in the dark and under illumination in order to elucidate the dominant transport mechanisms in amorphous silicon-crystalline silicon (a-Si:H/c-Si) heterojunction solar cells. ZnO:Al/(p)a-Si:H/(n)c-Si/(n(+))a-Si:H cells are compared with inversely doped structures and the impact of thin undoped a-Si:H buffer layers on charge carrier transport is explored. The solar cell I-V curves are analyzed employing a generalized two-diode model which allows fitting of the experimental data for a broad range of samples. The results obtained from the fitting are discussed using prevalent transport models under consideration of auxiliary data from constant-final-state-yield photoelectron spectroscopy, surface photovoltage, and minority carrier lifetime measurements. Thus, an in-depth understanding of the device characteristics is developed in terms of the electronic properties of the interfaces and thin films forming the heterojunction. It is shown that dark I-V curve fit parameters can unequivocally be linked to the open circuit voltage under illumination which opens a way to a simplified device assessment.
引用
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页数:13
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