Low threshold acquisition controller for Skipper charge-coupled devices

被引：35

作者：

Cancelo, Gustavo ^{[1
]}

Chavez, Claudio ^{[2
]}

Chierchie, Fernando ^{[3
]}

Estrada, Juan ^{[1
]}

Moroni, Guillermo Fernandez ^{[1
,3
]}

Paolini, Eduardo ^{[3
,4
]}

Haro, Miguel Sofo ^{[5
,6
]}

Soto, Angel ^{[3
]}

Stefanazzi, Leandro ^{[1
,3
]}

Tiffenberg, Javier ^{[1
]}

Treptow, Ken ^{[1
]}

Wilcer, Neal ^{[1
]}

Zmuda, Ted ^{[1
]}

机构：

[1] Fermilab Natl Accelerator Lab, POB 500, Batavia, IL 60510 USA

[2] Univ Nacl Asunc, Fac Ingn, Asuncion, Paraguay

[3] Univ Nacl, Inst Invest Ingn Elect Alfredo C Desages IIIE CON, Dept Ingn Elect & Computadoras, Bahia Blanca, Buenos Aires, Argentina

[4] Comis Invest Cient Prov Buenos Aires, Buenos Aires, DF, Argentina

[5] Univ Nacl Cuyo, Ctr Atom Bariloche, Rio Negro, Argentina

[6] Univ Nacl Cuyo, Inst Balseiro, Comis Nacl Energia Atom, Rio Negro, Argentina

来源：

JOURNAL OF ASTRONOMICAL TELESCOPES INSTRUMENTS AND SYSTEMS | 2021年 / 7卷 / 01期

关键词：

CCD controller; Skipper-CCD; charge-coupled device; sub-electron noise;

D O I：

10.1117/1.JATIS.7.1.015001

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

The development of the Skipper-charge-coupled devices (Skipper-CCDs) has been a major technological breakthrough for sensing very weak ionizing particles. The sensor allows to reach the ultimate sensitivity of silicon material as a charge signal sensor by unambiguous determination of the charge signal collected by each cell or pixel, even for single electron-hole pair ionization. Extensive use of the technology was limited by the lack of specific equipment to operate the sensor at the ultimate performance. A simple, single-board Skipper-CCD controller designed by the authors is presented and aimed for the operation of the detector in high sensitivity scientific applications. Our article describes the main components and functionality of the so-called low threshold acquisition controller together with experimental results when connected to a Skipper-CCD sensor. Measurements show unprecedented deep subelectron noise of 0.039 e(rms)(-)/pix by nondestructively measuring the charge 5000 times in each pixel. (C) 2021 Society of Photo-Optical Instrumentation Engineers (SPIE)

引用

页数：19

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