Modelling and analysis of crosstalk induced noise effects in bundle SWCNT interconnects and its impact on signal stability

被引:12
|
作者
Bagheri, Amin [1 ]
Ranjbar, Mahboubeh [2 ]
Haji-Nasiri, Saeed [2 ]
Mirzakuchaki, Sattar [3 ]
机构
[1] Islamic Azad Univ, Sci & Res Branch, Dept Elect Engn, Tehran, Iran
[2] Islamic Azad Univ, Qazvin Branch, Fac Elect Biomed & Mechatron Engn, Qazvin 3419915195, Iran
[3] Iran Univ Sci & Technol, Sch Elect Engn, Elect Res Ctr, POB 16846-13114, Tehran, Iran
关键词
Single wall carbon nanotubes (SWCNTs); Interconnects; Transmission line model (TLM); Nyquist stability; Step response; Crosstalk; CARBON NANOTUBE INTERCONNECTS; MWCNT BUNDLE; DELAY; TEMPERATURE; RELIABILITY; GROWTH;
D O I
10.1007/s10825-017-1028-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In order to analyse crosstalk delay and stability in single wall carbon nanotube bundle (SWCNT) interconnects, the time and frequency domain response are investigated in this paper. Based on the transmission line model and by using matrix formulation, we perform the Nyquist stability analysis to survey the dependence of the degree of relative stability for coupled SWCNT bundle interconnects. We present an exact transfer function formula for a SWCNT bundle and two coupled SWCNT bundle interconnects. The proposed model can be extended to coupled n bundled SWCNT interconnects. In order to demonstrate the crosstalk effects, we seek to compare the coupled SWCNT bundle interconnects with the SWCNT bundle interconnect. The results show that due to the capacitive and mutual inductive couplings between two SWCNT bundles, the stability of near-end output increases and the created undesirable voltage on the far-end output may reduce the stability and degrade logic. Also, it is observed that stability and switching delay of near-end output increases with increasing the interconnect length and diameter. Furthermore, maximum overshoot and switching delay of far-end output increases with length and diameter of interconnect. Also, as the parasitic coupling capacitance increases and the mutual inductance decreases, stability of near-end output increases whereas the stability of the far-end output decreases. Finally, compared to Advanced Design System results, the model exhibits an excellent accuracy.
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页码:845 / 855
页数:11
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