TEM characterization of the artefacts induced by FIB in austenitic stainless steel

被引：13

作者：

Andrzejczuk, M. ^{[1
]}

Plocinski, T. ^{[1
]}

Zielinski, W. ^{[1
]}

Kurzydlowski, K. J. ^{[1
]}

机构：

[1] Warsaw Univ Technol, Fac Mat Sci & Engn, PL-02507 Warsaw, Poland

来源：

JOURNAL OF MICROSCOPY-OXFORD | 2010年 / 237卷 / 03期

关键词：

Artefacts; FIB; microstructure characterization; TEM; FOCUSED ION-BEAM; SPECIMENS; DAMAGE; TECHNOLOGY;

D O I：

10.1111/j.1365-2818.2009.03288.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Transmission electron microscopy studies of the artefacts in the form of network of dislocations induced by focused ion beam technique in austenitic stainless steel have been performed. Images of the microstructure with different diffraction vector g were analyzed. Transmission electron microscopy investigations of the artefacts induced by focused ion beam machining in the austenite revealed set of parallel dislocations with edge character located near the free surface of the thin foils.

引用

页码：439 / 442

页数：4

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