Emission limited electrostatic atomization and the fine structure constant

被引:0
|
作者
Kelly, AJ [1 ]
机构
[1] ZYW Corp, Princeton Jct, NJ 08550 USA
来源
TECHNICAL DIGEST OF THE 17TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE | 2004年
关键词
D O I
10.1109/IVNC.2004.1354969
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Quadrupole mass spectrometer measurements of charged Octoil sprays, as displayed in Figure 1, reveal that operation in the emission limited regime is accurately represented by Z = exp(epsilon(0)/epsilon-r(s)/f), where: Z is the fraction of the emission limited charge level, epsilon(0)/epsilon the inverse relative dielectric constant of the spray fluid, r(s) the coupling parameter, and f is the inverse fine structure constant (137.04). The coupling parameter, (r(s)) defined as 1/(a(0)rootpin), where a(0) is the first Bohr radius, and n the surface charge density (m(-2)), is a non-dimensional measure of inter-charge spacing, and a fundamental descriptor of limited dimension (2-D) electron structures. This parameter implicates the physics of surface charge as the controlling element for emission limited electrostatic atomization. Moreover, this relationship forces the conclusion that the limiting emission electric field cannot be a constant.
引用
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页码:196 / 197
页数:2
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