Effects of surfactant on surface morphology and orientation of Nb-doped Bi4Ti3O12 thin films

被引：0

作者：

Kim, SS ^{[1
]}

Choi, EK

Kim, JK

Kim, JS

Song, TK

Kim, J

机构：

[1] Changwon Natl Univ, Dept Phys, Chang Won 641773, South Korea

[2] Changwon Natl Univ, Inst Basic Sci, Chang Won 641773, South Korea

[3] Changwon Natl Univ, Dept Ceram Sci & Engn, Chang Won 641773, South Korea

[4] Changwon Natl Univ, Dept Chem Engn Syst, Chang Won 641773, South Korea

来源：

JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2003年 / 42卷

关键词：

Bi4Ti3O12; thin film; surfactant; orientation; ferroelectric property;

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have tried to use surfactants in order to tune the shape and orientation of Nb-doped Bi4Ti3O12 (BITNb) thin films. BITNb thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates by a metalorganic solution deposition method. The precursor solution for the BITNb thin films was modified with adding surfactant cetyltrimethylammonium bromide in acid or basic atmospheres. The measured XRD patterns revealed that the BITNb thin film prepared with a surfactant in acid atmosphere showed only a Bi4Ti3O12-type phase with highly c-axis orientation. However, for the BITNb thin film prepared without surfactant showed random orientation. The remanent polarization (2P(r)) and the coercive field (2E(c)) of BITNb thin films with c-axis and random orientation were 2.0 muC/cm(2) and 14.9 kV/cm, and 12.3 muC/cm(2) and 113.9 kV/cm, respectively.

引用

页码：S1126 / S1129

页数：4

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