Stochastic processes for line shapes and intensities

被引：1

作者：

Stamm, R. ^{[1
]}

Hammami, R. ^{[1
]}

Hannachi, I. ^{[2
]}

Capes, H. ^{[1
]}

Godbert-Mouret, L. ^{[1
]}

Koubiti, M. ^{[1
]}

Marandet, Y. ^{[1
]}

Rosato, J. ^{[1
]}

机构：

[1] Aix Marseille Univ CNRS, UMR 7345, Marseille, France

[2] Univ Batna, Dept Mat Sci, Fac Sci, Batna, Algeria

来源：

ADVANCES IN SPACE RESEARCH | 2014年 / 54卷 / 07期

关键词：

Stochastic process; Stark broadening; Line shape; Atomic population; Turbulence; STARK PROFILES; HYDROGEN; MODEL; PLASMA; TURBULENCE; DENSITY;

D O I：

10.1016/j.asr.2013.11.045

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

Stochastic processes provide flexible and fast calculations for modeling dynamical interactions between an atom and charged particles. We use a stochastic renewal process for the plasma microfield being the cause of Stark broadening. The accuracy and improvement possibilities of Lyman profiles calculations with a renewal process are analyzed by comparing to ab initio simulations for ion broadening only. Stochastic processes may also be applied to out of equilibrium plasmas. We present our first results for the effect of Langmuir waves on a line broadened by electrons only, and for the changes of atomic populations submitted to strong temperature fluctuations. (C) 2013 COSPAR. Published by Elsevier Ltd. All rights reserved.

引用

页码：1152 / 1158

页数：7

共 29 条

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