The non-linear fitting method to analyze the measured M-S plots of bipolar passive films

被引:63
作者
Jiang, Ruijing [1 ]
Chen, Changfeng [1 ]
Zheng, Shuqi [1 ]
机构
[1] China Univ Petr, Dept Mat Sci & Engn, Beijing 102249, Peoples R China
基金
中国国家自然科学基金;
关键词
Bipolar; Passive film; Mott-Schottky plot; Non-linear fitting; ELECTRONIC-STRUCTURE; CHEMICAL-COMPOSITION; STAINLESS-STEEL; ALLOYS; TEMPERATURE; BEHAVIOR; CR;
D O I
10.1016/j.electacta.2009.11.093
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Mott-Schottky (M-S) analysis is an effective approach to investigate the electronic property of passive films of metals, and it is well suitable for the passive film with single space charge capacitance. But there is no proper method to analyze the C-sc(-2) vs. V-m plots of passive films with several space charge capacitances in series connection, such as bipolar passive films. In this paper, the relationship between the space charge capacitance of the bipolar passive film and the applied potential was deduced and the features of corresponding plots were given out simultaneously. Accordingly, a non-linear fitting method was presented to analyze the C-sc(-2) vs. V-m plots of bipolar passive films. Then the method was used to study the semiconductor characteristics of bipolar passive films formed on the surface of Nickel base alloy after being corroded in the environments with high temperatures and high partial pressures of H2S/CO2. The fitting results indicate that the non-linear fitting of M-S plots can well help to understand the anti-corrosion mechanism of bipolar passive films. (C) 2009 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2498 / 2504
页数:7
相关论文
共 25 条
[1]  
BALKANSKI M, 2000, SEMICONDUCTOR PHYS A, P319
[2]  
BALKANSKI M, 2000, SEMICONDUCTOR PHYS A, P307
[3]   A NEW MODEL FOR THE SEMICONDUCTOR ELECTROLYTE INTERFACE AND THE ORIGIN OF MOTT-SCHOTTKY DATA DISPERSION [J].
BRAUN, CM ;
FUJISHIMA, A ;
HONDA, K ;
NADJO, L .
SURFACE SCIENCE, 1986, 176 (1-2) :367-376
[4]   PHOTOELECTROCHEMICAL PROPERTIES OF A GAP ELECTRODE WITH AN N/P JUNCTION [J].
CARLSSON, P ;
UOSAKI, K ;
HOLMSTROM, B ;
KITA, H .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1989, 136 (02) :524-528
[5]   Electrochemical behaviour of thermally treated Cr-oxide films deposited on stainless steel [J].
Carmezim, MJ ;
Simoes, AM ;
Figueiredo, MO ;
Belo, MD .
CORROSION SCIENCE, 2002, 44 (03) :451-465
[6]   Influence of the temperature of film formation on the electronic structure of oxide films formed on 304 stainless steel [J].
Ferreira, MGS ;
Hakiki, NE ;
Goodlet, G ;
Faty, S ;
Simoes, AMP ;
Belo, MD .
ELECTROCHIMICA ACTA, 2001, 46 (24-25) :3767-3776
[7]   Semiconductor properties and protective role of passive films of iron base alloys [J].
Fujimoto, Shinji ;
Tsuchiya, Hiroaki .
CORROSION SCIENCE, 2007, 49 (01) :195-202
[8]   PHYSICAL THEORY OF SEMICONDUCTOR SURFACES [J].
GARRETT, CGB ;
BRATTAIN, WH .
PHYSICAL REVIEW, 1955, 99 (02) :376-387
[9]  
GROVE AS, 1967, PHYS TECHNOLOGY SEMI, P153
[10]   THE ELECTRONIC-STRUCTURE OF PASSIVE FILMS FORMED ON STAINLESS-STEELS [J].
HAKIKI, NE ;
BOUDIN, S ;
RONDOT, B ;
BELO, MD .
CORROSION SCIENCE, 1995, 37 (11) :1809-1822