Anisotropic nanostructure formation by vapor etching of ion tracks in α-quartz

被引:6
|
作者
Toro, Maria C. Garcia [1 ]
Crespillo, Miguel L. [2 ,3 ]
Olivares, Jose [3 ,4 ]
Graham, Joseph T. [1 ,5 ]
机构
[1] Missouri Univ Sci & Technol, Dept Nucl Engn & Radiat Sci, Rolla, MO 65409 USA
[2] Univ Tennessee, Dept Mat Sci & Engn, Knoxville, TN 37996 USA
[3] Univ Autonoma Madrid, Ctr Microanal Mat CMAM, E-28049 Madrid, Spain
[4] CSIC, Inst Opt, IO, CSIC, E-28006 Madrid, Spain
[5] Missouri Univ Sci & Technol, Dept Mat Sci & Engn, Rolla, MO 65409 USA
关键词
Nanostructures; Chemical etching; alpha-Quartz; Ion tracks; Ion beam modification of materials; SILICON DIOXIDE; HEAVY-IONS; THIN-FILMS; CUT QUARTZ; SIO2; SWIFT; KINETICS; DAMAGE; IRRADIATION; MECHANISMS;
D O I
10.1016/j.nimb.2021.04.013
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In this study, latent and etched ion tracks generated by high electronic excitation in alpha quartz (alpha-SiO2) were characterized. Single crystals of Y- and Z-cut alpha-SiO2 were irradiated at room temperature with 20 MeV Ni6+ ions and 40 MeV I7+ ions. The track morphology depends on the energy of the incident ion and the stopping power on the target material. Subsequent chemical vapor-etching with hydrofluoric acid solutions was conducted with varying etching times and acid concentrations. The vapor etching process produced nanostructures whose dimensions increased with etching time and etchant concentrations. Y-cut samples etched more slowly than Z-cut samples and exhibited anisotropic track etching behavior. Production of nanowells with different aspect ratios was accomplished by altering the etching time and etchant concentration. The nanowells were characterized by Atomic Force Microscopy. The etched nanostructure templates could be used in the fabrication of novel nanodevices with unique optical, thermal, and electronic properties.
引用
收藏
页码:52 / 60
页数:9
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