Friedel oscillations in graphene-based systems probed by Scanning Tunneling Microscopy

被引:13
作者
Mallet, Pierre [1 ,2 ]
Brihuega, Ivan [3 ]
Cherkez, Vladimir [1 ,2 ,4 ]
Maria Gomez-Rodriguez, Jose [3 ]
Veuillen, Jean-Yves [1 ,2 ]
机构
[1] Univ Grenoble Alpes, Inst Neel, F-38042 Grenoble, France
[2] CNRS, Inst Neel, F-38042 Grenoble, France
[3] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain
[4] LNCMI, CNRS, UJF, UPS,INSA, 25 Rue Martyrs, F-38042 Grenoble, France
关键词
Friedel oscillations; Graphene; Dirac fermions; Electronic pseudospin; Scanning tunneling microscopy; 2-DIMENSIONAL FERMI CONTOUR; QUANTUM INTERFERENCE; LOCALIZATION; SCATTERING; ELECTRONS;
D O I
10.1016/j.crhy.2015.12.013
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
For the last 25 years, scientists have demonstrated the capabilities of Scanning Tunneling Microscopy (STM) to visualize in real space the response of a two-dimensional electron gas to atomic-scale impurities. The analysis of the Friedel oscillations surrounding the impurities yields valuable information regarding the elastic scattering properties, the band structure, the doping level and the symmetry of the electronic states in the two-dimensional host system. We will address in this article the use of this technique for probing the electronic properties of graphene, the star two-dimensional compound of the last decade. In particular, we will emphasize how this technique can be pushed up to unravel the electronic pseudospin, a distinctive degree of freedom of graphene's Dirac fermions. (C) 2015 Academie des sciences. Published by Elsevier Masson SAS.
引用
收藏
页码:294 / 301
页数:8
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