Implementation of modeling and simulation in semiconductor wafer fabrication with time constraints between wet etch and furnace operations

被引:46
作者
Scholl, W [1 ]
Domaschke, J
机构
[1] Infineon Technol Dresden, Dresden, Germany
[2] Infineon Technol, Munich, Germany
关键词
discrete event simulation; modeling methodology; semiconductor manufacturing; time bound sequences; time constraints;
D O I
10.1109/66.857935
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In semiconductor wafer fabrication, time constraints between process steps in furnace and wet etch make it difficult to achieve cycle time targets and maximize machine utilization. For capacity planning, it is difficult to estimate the impact of these time constraints on the machine capacity. Infineon Technologies Dresden has conducted a study, using discrete event simulation, to investigate the actual situation in the factory and to identify recommendations to eliminate or to reduce the impact of time constraints. The work in this paper yields a two-day reduction in total cycle time after implementation of findings in the factory.
引用
收藏
页码:273 / 277
页数:5
相关论文
共 6 条
[1]  
BROWN S, 1997, FUTURE FAB INT, V3, P83
[2]  
CHANCE F, 1996, FACTORY EXPLORER USE
[3]  
FOWLER JW, MEASUREMENT IMPROVEM
[4]  
HOPP WJ, 1996, FACTORY PHYSICS FDN
[5]  
ROBINSON JK, 1999, P 1999 WINT SIM C, P8800
[6]  
WINZ JP, 1999, C P 1999 IEEE INT S, P81