nitric oxide;
mitochondria;
electron transport chain;
neurodegeneration;
glia;
neuron;
free radicals;
D O I:
10.1016/S0891-5849(02)01327-8
中图分类号:
Q5 [生物化学];
Q7 [分子生物学];
学科分类号:
071010 ;
081704 ;
摘要:
Excessive generation of nitric oxide (NO) has been implicated in the pathogenesis of several neurodegenerative disorders. Damage to the mitochondrial electron transport chain has also been implicated in these disorders. NO and its toxic metabolite peroxynitrite (ONOO-) can inhibit the mitochondrial respiratory chain, leading to energy failure and ultimately cell death. There appears to be a differential susceptibility of brain cell types to NO/ONOO-, which may be influenced by factors including cellular antioxidant status and the ability to maintain energy requirements in the face of marked respiratory chain damage. Although formation of NO/ONOO- following cytokine exposure does not affect astrocyte survival, these molecules may diffuse out and cause mitochondrial damage to neighboring NO/ONOO- sensitive cells such as neurons. Evidence suggests that NO/ONOO- causes release of neuronal glutamate, leading to glutamate-induced activation of neuronal NO synthase and generation of further damaging species. While neurons appear able to recover from short-term exposure to NO/ONOO-, extending the period of exposure results in persistent damage to the respiratory chain and cell death ensues. These findings have important implications for acute infection vs. chronic neuroinflammatory disease states. The evidence for NO/ONOO--mediated mitochondrial damage in neurodegenerative disorders is reviewed and potential therapeutic strategies are discussed. (C) 2003 Elsevier Science Inc.
机构:
Feil Family Brain & Mind Res Inst, Weill Cornell Med, New York, NY 10065 USA
Weill Cornell Med, 407 East 61st St,RR508, New York, NY 10065 USAFeil Family Brain & Mind Res Inst, Weill Cornell Med, New York, NY 10065 USA
McAvoy, Kevin
Kawamata, Hibiki
论文数: 0引用数: 0
h-index: 0
机构:
Feil Family Brain & Mind Res Inst, Weill Cornell Med, New York, NY 10065 USA
Weill Cornell Med, 407 East 61st St,RR508, New York, NY 10065 USAFeil Family Brain & Mind Res Inst, Weill Cornell Med, New York, NY 10065 USA
机构:
Life Univ N France, Dept Physiol EA 4484, Fac Med, F-59045 Lille, France
CHRU Lille, Univ Hosp, Dept Anesthesiol, F-59045 Lille, FranceLife Univ N France, Dept Physiol EA 4484, Fac Med, F-59045 Lille, France
Robin, Emmanuel
Derichard, Alexandre
论文数: 0引用数: 0
h-index: 0
机构:
Life Univ N France, Dept Physiol EA 4484, Fac Med, F-59045 Lille, France
CHRU Lille, Univ Hosp, Dept Anesthesiol, F-59045 Lille, FranceLife Univ N France, Dept Physiol EA 4484, Fac Med, F-59045 Lille, France
Derichard, Alexandre
Vallet, Benoit
论文数: 0引用数: 0
h-index: 0
机构:
Life Univ N France, Dept Physiol EA 4484, Fac Med, F-59045 Lille, France
CHRU Lille, Univ Hosp, Dept Anesthesiol, F-59045 Lille, FranceLife Univ N France, Dept Physiol EA 4484, Fac Med, F-59045 Lille, France
Vallet, Benoit
Hassoun, Sidi Mohamed
论文数: 0引用数: 0
h-index: 0
机构:
Life Univ N France, Dept Physiol EA 4484, Fac Med, F-59045 Lille, FranceLife Univ N France, Dept Physiol EA 4484, Fac Med, F-59045 Lille, France
Hassoun, Sidi Mohamed
Neviere, Remi
论文数: 0引用数: 0
h-index: 0
机构:
Life Univ N France, Dept Physiol EA 4484, Fac Med, F-59045 Lille, FranceLife Univ N France, Dept Physiol EA 4484, Fac Med, F-59045 Lille, France