Additive-subtractive two-wavelength ESPI contouring by using a synthetic wavelength phase shift

被引：24

作者：

Hack, E ^{[1
]}

Frei, B ^{[1
]}

Kastle, R ^{[1
]}

Sennhauser, U ^{[1
]}

机构：

[1] Swiss Fed Labs Mat Testing & Res, CH-8600 Dubendorf, Switzerland

来源：

APPLIED OPTICS | 1998年 / 37卷 / 13期

关键词：

D O I：

10.1364/AO.37.002591

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The addition correlation of two speckle fields by simultaneous illumination at different wavelengths is used for object contouring in a Twyman-Green-type interferometer. Fringe visibility is enhanced when the stochastic speckle background intensity obtained from a reference plane modulation is subtracted. We calculate the contour phase map by using a phase-shift algorithm in the synthetic wavelength. A comparison with a sequential illumination, phase difference method based on a laser wavelength phase shift is given. The test setup does not need to be stable on an interferometric scale, and therefore a method is provided that lends itself to applications in noisy environments. (C) 1998 Optical Society of America.

引用

页码：2591 / 2597

页数：7

共 14 条

[1]

ATCHA H, 1991, SPIE, V1504, P221

[2] ADDITIVE-SUBTRACTIVE PHASE-MODULATED SHEAROGRAPHY WITH SYNCHRONIZED ACOUSTIC STRESSING [J].

CHATTERS, TC ;

POUET, BF ;

KRISHNASWAMY, S .

EXPERIMENTAL MECHANICS, 1995, 35 (02) :159-165

[3] ROUGH-SURFACE INTERFEROMETRY WITH A 2-WAVELENGTH HETERODYNE SPECKLE INTERFEROMETER [J].

FERCHER, AF ;

HU, HZ ;

VRY, U .

APPLIED OPTICS, 1985, 24 (14) :2181-2188

[4]

GULKER G, 1992, APPL OPTICS, V31, P4519, DOI 10.1364/AO.31.004519

[5] MULTIPLE-WAVELENGTH AND MULTIPLE-SOURCE HOLOGRAPHY APPLIED TO CONTOUR GENERATION [J].

HILDEBRAND, BP ;

HAINES, KA .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (02) :155-+

[6]

Jones R., 1989, HOLOGRAPHIC SPECKLE, DOI DOI 10.1017/CBO9780511622465

[7] 3-COORDINATE MEASUREMENT OF AN OBJECT SURFACE WITH A COMBINED 2-WAVELENGTH AND 2-SOURCE PHASE-SHIFTING SPECKLE INTERFEROMETER [J].

MAACK, T ;

NOTNI, G ;

SCHREIBER, W .

OPTICS COMMUNICATIONS, 1995, 115 (5-6) :576-584

[8] Contrast enhancement of electronic speckle pattern interferometry addition fringes [J].

Ochoa, NA ;

Santoyo, FM ;

Moore, AJ ;

Lopez, CP .

APPLIED OPTICS, 1997, 36 (13) :2783-2787

[9]

PENG X, 1992, OPTIK, V91, P81

[10] 2-WAVELENGTH INTERFEROMETRY [J].

POLHEMUS, C .

APPLIED OPTICS, 1973, 12 (09) :2071-2074

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