共 13 条
Structured epitaxial graphene growth on SiC by selective graphitization using a patterned AlN cap
被引:14
作者:

Rubio-Roy, Miguel
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Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Zaman, Farhana
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Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Hu, Yike
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h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Berger, Claire
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h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Moseley, Michael W.
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Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Meindl, James D.
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Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

de Heer, Walt A.
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Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
机构:
[1] Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
[2] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
基金:
美国国家科学基金会;
关键词:
ellipsometry;
epitaxial growth;
graphene;
graphitisation;
Hall mobility;
Raman spectra;
silicon compounds;
D O I:
10.1063/1.3334683
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Electronic quality epitaxial graphene has been selectively grown on silicon carbide capped with a patterned aluminum nitride layer, providing a pathway to produce device structures that avoid lithographic patterning of graphene itself. Patterning of the cap exposes SiC where graphene will grow. Capped areas inhibit graphene growth and withstand graphitization temperatures up to 1420 degrees C under 100 Pa of argon pressure. Graphene Hall bars were fabricated and characterized by scanning Raman spectroscopy, ellipsometry, and transport measurements. Hall-mobility is about 600 cm(2)/V s and can be further enhanced by fine tuning the argon pressure and improving the quality of SiC surface prior to graphitization.
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