Polarization independent broadband terahertz antireflection by deep-subwavelength thin metallic mesh

被引:22
作者
Ding, Lu [1 ]
Wu, Qing Yang Steve [1 ]
Teng, Jing Hua [1 ]
机构
[1] ASTAR, Inst Mat Res & Engn, Singapore 117602, Singapore
关键词
Metamaterials; terahertz; broadband antireflection; polarization; subwavelength metallic structures; OPTICAL-SYSTEMS; NEGATIVE INDEX; REFRACTION; FILMS; CONDUCTIVITY;
D O I
10.1002/lpor.201400135
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Broadband antireflection coatings for passive terahertz (THz) components are extremely important in the application of THz technology. Metallic nano-films are commonly used for this purpose. Here a new approach to realize polarization independent broadband antireflection in THz range, based on a meta-surface design is experimentally demonstrated. The internal reflection of a broadband THz pulse (spectral bandwidth of 0.06 - 4 THz) at a Si/air interface can be fully suppressed with a Cr square mesh with deep-subwavelength dimensions. Small nonuniformity of the meta-surface structure can enhance the tolerance on structural parameters for achieving the AR condition. The design concept is applicable to other metals and frequency ranges as well, which opens a new window for future AR coatings.
引用
收藏
页码:941 / 945
页数:5
相关论文
共 27 条
  • [1] Bigun R.I., 2010, NANOSYST NANOMATER N, V8, P129
  • [2] Born M., 1999, Principles of optics, Vseventh
  • [3] Antireflection Coating Using Metamaterials and Identification of Its Mechanism
    Chen, Hou-Tong
    Zhou, Jiangfeng
    O'Hara, John F.
    Chen, Frank
    Azad, Abul K.
    Taylor, Antoinette J.
    [J]. PHYSICAL REVIEW LETTERS, 2010, 105 (07)
  • [4] A terahertz metamaterial with unnaturally high refractive index
    Choi, Muhan
    Lee, Seung Hoon
    Kim, Yushin
    Kang, Seung Beom
    Shin, Jonghwa
    Kwak, Min Hwan
    Kang, Kwang-Young
    Lee, Yong-Hee
    Park, Namkyoo
    Min, Bumki
    [J]. NATURE, 2011, 470 (7334) : 369 - 373
  • [5] Terahertz time-domain spectroscopy characterization of the far-infrared absorption and index of refraction of high-resistivity, float-zone silicon
    Dai, JM
    Zhang, JQ
    Zhang, WL
    Grischkowsky, D
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2004, 21 (07) : 1379 - 1386
  • [6] Perfect Broadband Terahertz Antireflection by Deep-Subwavelength, Thin, Lamellar Metallic Gratings
    Ding, Lu
    Wu, Qing Yang Steve
    Song, Jun Feng
    Serita, Kazunori
    Tonouchi, Masayoshi
    Teng, Jing Hua
    [J]. ADVANCED OPTICAL MATERIALS, 2013, 1 (12): : 910 - 914
  • [7] MEAN FREE-PATH AND DENSITY OF CONDUCTANCE ELECTRONS IN PLATINUM DETERMINED BY THE SIZE EFFECT IN EXTREMELY THIN-FILMS
    FISCHER, G
    HOFFMANN, H
    VANCEA, J
    [J]. PHYSICAL REVIEW B, 1980, 22 (12): : 6065 - 6073
  • [8] The conductivity of thin metallic films according to the electron theory of metals
    Fuchs, K
    [J]. PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 : 100 - 108
  • [9] HOFFMANN H, 1981, THIN SOLID FILMS, V85, P147, DOI 10.1016/0040-6090(81)90627-1
  • [10] IMAGING WITH TERAHERTZ WAVES
    HU, BB
    NUSS, MC
    [J]. OPTICS LETTERS, 1995, 20 (16) : 1716 - &