Monte Carlo simulation of noncubic symmetry semiconducting materials and devices

被引:25
作者
Brennan, KF [1 ]
Bellotti, E
Farahmand, M
Nilsson, HE
Ruden, PP
Zhang, YM
机构
[1] Georgia Tech, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
[2] Mid Sweden Univ, Dept Informat Technol, S-85170 Sundsvall, Sweden
[3] Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA
基金
美国国家科学基金会;
关键词
Monte Carlo method; semiconductors; wide band gap;
D O I
10.1109/16.870567
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we discuss the complexities that arise in Monte Carlo based modeling of noncubic symmetry semiconductors and their related devices. We have identified three general issues, band structure, scattering mechanisms, and band intersections that require some modification of the Monte Carlo simulator from that for cubic symmetry. Owing to the increased size and number of atoms per unit cell, the band structure is far more complex in noncubic than in zincblende phase semiconductors. This added complexity is reflected by the greater number of bands, smaller Brillouin zone and concomitant increase in the number of band intersections. We present strategies for modeling the effects of band intersections on the carrier dynamics using the Monte Carlo method. It is found that the band intersection points greatly affect the carrier transport, most dramatically in the determination of the impact ionization and breakdown properties of devices and bulk material. Excellent agreement with experimental measurements of the impact ionization coefficients is obtained only when treatment of the band intersections is included within the model.
引用
收藏
页码:1882 / 1890
页数:9
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