In situ scanning electron microscopy of graphene nucleation during segregation of carbon on polycrystalline Ni substrate

被引：10

作者：

Momiuchi, Yuta ^{[1
]}

Yamada, Kazuki ^{[1
]}

Kato, Hiroki ^{[1
]}

Homma, Yoshikazu ^{[1
]}

Hibino, Hiroki ^{[2
]}

Odahara, Genki ^{[3
]}

Oshima, Chuhei ^{[3
]}

机构：

[1] Tokyo Univ Sci, Dept Phys, Shinjuku Ku, Tokyo 1628601, Japan

[2] NTT Corp, NTT Basic Res Labs, Atsugi, Kanagawa 2430198, Japan

[3] Waseda Univ, Dept Appl Phys, Shinjuku Ku, Tokyo 1690072, Japan

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2014年 / 47卷 / 45期

关键词：

graphene; nickel; scanning electron microscopy; segregation; in situ observation; MONOLAYER GRAPHITE; NI(111); SURFACE; GROWTH; NICKEL;

D O I：

10.1088/0022-3727/47/45/455301

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In situ scanning electron microscopy (SEM) was used for observing the nucleation of graphene by segregation of bulk-dissolved carbon on a flat polycrystalline nickel surface. Preferential nucleation sites were determined on large (1 1 1) grains. In combination with ex situ atomic force microscopy measurements at the same area as with SEM, the nucleation sites were found to have step-bunched structures. Possible nucleation mechanisms are discussed based on the difference in the carbon concentration and critical nucleus size between the (1 1 1) terrace and step bunches.

引用

页数：5