Bidirectional reflectance distribution function measurements and analysis of retroreflective materials

被引：15

作者：

Belcour, Laurent ^{[1
,2
]}

Pacanowski, Romain ^{[3
]}

Delahaie, Marion ^{[4
]}

Laville-Geay, Aude ^{[4
]}

Eupherte, Laure ^{[4
]}

机构：

[1] Inria Bordeaux Sud Ouest, F-33405 Talence, France

[2] Univ Montreal, Montreal, PQ, Canada

[3] CNRS, F-33402 Talence, France

[4] CEA, F-33116 Le Barp, France

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2014年 / 31卷 / 12期

关键词：

2ND-ORDER SHADOWING FUNCTION; ROUGH DIELECTRIC SURFACES; HIGH-FREQUENCY LIMIT; RETRO-REFLECTION; MULTIPLE-SCATTERING; GLASS-BEADS; BRDF; BACKSCATTERING;

D O I：

10.1364/JOSAA.31.002561

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We compare the performance of various analytical retroreflecting bidirectional reflectance distribution function (BRDF) models to assess how they reproduce accurately measured data of retroreflecting materials. We introduce a new parametrization, the back vector parametrization, to analyze retroreflecting data, and we show that this parametrization better preserves the isotropy of data. Furthermore, we update existing BRDF models to improve the representation of retroreflective data. (C) 2014 Optical Society of America

引用

页码：2561 / 2572

页数：12

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