Optical form measurement employing a tiltable line scanning, low coherence interferometer for annular subaperture stitching interferometry

被引:1
作者
Schake, Markus [1 ]
Riebeling, Jorg [2 ]
Lehmann, Peter [2 ]
Ehret, Gerd [1 ]
机构
[1] Physikal Tech Bundesanstalt, Bundesallee 100, D-38116 Braunschweig, Germany
[2] Univ Kassel FB Elektrotech Informat, FG Messtechn, Wilhelmshoher Allee 71, D-34121 Kassel, Germany
关键词
interferometry; annular subaperture stitching; aspherical optics; form measurement; path length modulation; measurement uncertainty; POLYNOMIALS; ALGORITHM; SURFACES; ASPHERES;
D O I
10.1088/1361-6501/abfe83
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This contribution presents experimental and simulation results of a tiltable line scanning low coherence interferometer applied for form measurement of spherical and aspherical objects with a diameter of up to 300 mm. The region of interest is sampled by multiple annular subapertures that are realigned employing stitching algorithms based on Cartesian- and Zernike polynomial fittings. The paper addresses common challenges in the reduction and modeling of displacement errors associated with the motion of the interferometric sensor between subaperture measurements and compares the topography deviations of the experimental results with those simulated by a Monte Carlo based model.
引用
收藏
页数:17
相关论文
共 25 条
[1]  
[Anonymous], 2008, 100 JCGM
[2]   Calibration of a non-null test interferometer for the measurement of aspheres and free-form surfaces [J].
Baer, Goran ;
Schindler, Johannes ;
Pruss, Christof ;
Siepmann, Jens ;
Osten, Wolfgang .
OPTICS EXPRESS, 2014, 22 (25) :31200-31211
[3]   Metrological multispherical freeform artifact [J].
Blobel, Gernot ;
Wiegmann, Axel ;
Siepmann, Jens ;
Schulz, Michael .
OPTICAL ENGINEERING, 2016, 55 (07)
[4]   Fast two-dimensional phase-unwrapping algorithm based on sorting by reliability following a noncontinuous path [J].
Herráez, MA ;
Burton, DR ;
Lalor, MJ ;
Gdeisat, MA .
APPLIED OPTICS, 2002, 41 (35) :7437-7444
[5]   Experimental study on measurement of aspheric surface shape with complementary annular subaperture interferometric method [J].
Hou, Xi ;
Wu, Fan ;
Yang, Li ;
Chen, Qiang .
OPTICS EXPRESS, 2007, 15 (20) :12890-12899
[6]   Full-aperture wavefront reconstruction from annular subaperture interferometric data by use of Zernike annular polynomials and a matrix method for testing large aspheric surfaces [J].
Hou, Xi ;
Wu, Fan ;
Yang, Li ;
Wu, Shibin ;
Chen, Qiang .
APPLIED OPTICS, 2006, 45 (15) :3442-3455
[7]   Continuous measurement of optical surfaces using a line-scan interferometer with sinusoidal path length modulation [J].
Knell, Holger ;
Laubach, Soeren ;
Ehret, Gerd ;
Lehmann, Peter .
OPTICS EXPRESS, 2014, 22 (24) :29787-29798
[8]  
Kuchel Michael F., 2009, Proceedings of the SPIE - The International Society for Optical Engineering, V7389, DOI 10.1117/12.830655
[9]   Combination of a fast white-light interferometer with a phase shifting interferometric line sensor for form measurements of precision components [J].
Laubach, Soeren ;
Ehret, Gerd ;
Riebling, Joerg ;
Lehmann, Peter .
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION X, 2017, 10329
[10]   Fundamental aspects of resolution and precision in vertical scanning white-light interferometry [J].
Lehmann, Peter ;
Tereschenko, Stanislav ;
Xie, Weichang .
SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES, 2016, 4 (02)