Short-circuiting effect on the magnetoresistance of microstructured permalloy rings

被引：2

作者：

Chao, C. T.

Lin, L. K.

Wu, J. C. ^{[1
]}

Wei, Zung-Hang

Lai, Mei-Feng

Chang, Ching-Ray

机构：

[1] Natl Changhua Univ Educ, Dept Phys, Gifu 500, Taiwan

[2] Natl Tsing Hua Univ, Dept Power Mech Engn, Hsinchu 300, Taiwan

[3] Natl Taiwan Univ, Dept Engn Sci & Ocean Engn, Taipei 10617, Taiwan

[4] Natl Taiwan Univ, Dept Phys, Taipei 10617, Taiwan

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2007年 / 310卷 / 02期

关键词：

permalloy ring; magnetoresistance; domain wall; vortex;

D O I：

10.1016/j.jmmm.2006.11.026

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present a systematic investigation of the current/voltage lead effect on magnetization reversal of microstructured permalloy rings. The magnetic rings with film thickness of 23nm and outer/inner diameter of 5/3 mu m, respectively, were patched by nonmagnetic gold leads designed with various angles, 10 degrees, 20 degrees, and 30 degrees. Longitudinal magnetoresistance measurement was adopted to demonstrate the short-circuiting effect. The mechanism can be attributed to the formation of the vortex structures developed beneath the lead-covered areas, in which the vortex pair domain configuration was confirmed using a magnetic force microscopy. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：1986 / 1988

页数：3

共 4 条

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