Challenges of testing high-volume, low-cost 8-bit microcontrollers

被引：0

作者：

Stout, M ^{[1
]}

Tumin, K ^{[1
]}

Vargas, C ^{[1
]}

Gotchall, B ^{[1
]}

机构：

[1] Motorola Inc, Bit Prod Div 8 16, Austin, TX 78735 USA

来源：

41ST ANNUAL PROCEEDINGS: INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM | 2003年

关键词：

D O I：

10.1109/RELPHY.2003.1197775

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper compares the development and effectiveness of scanbased testing and functional testing using two microcontroller studies. This design-for-test methodology has been shown to reliably produce high quality products. This approach also provides a diagnostic failure analysis methodology that can greatly improve detection of quality and reliability failures.

引用

页码：366 / 371

页数：6